Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/cover_reg_top/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

3 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block] 100.00 1 100 1 64 64
tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block] 100.00 1 100 1 64 64
tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 0 14 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 0 2 100.00 100 1 1 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0



Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 1 13 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 1 1 50.00 100 0 0 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0



Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 1 13 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 1 1 50.00 100 0 0 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 24925412 1 T14 142 T23 12 T24 2387
auto[1] 5145235 1 T29 778 T25 150 T126 7



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 30070449 1 T14 142 T23 12 T24 2387
values[1] 21 1 T209 1 T210 1 T230 1
values[2] 2 1 T232 1 T261 1 - -
values[3] 100 1 T126 10 T209 11 T210 1



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 30070445 1 T14 142 T23 12 T24 2387
values[1] 20 1 T126 2 T209 1 T210 3
values[2] 6 1 T209 1 T210 1 T233 1
values[3] 97 1 T126 6 T209 2 T210 3



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 30070347 1 T14 142 T23 12 T24 2387
auto[TlIntgErrCmd] 98 1 T126 9 T209 10 T210 2
auto[TlIntgErrData] 102 1 T126 5 T209 4 T210 6
auto[TlIntgErrBoth] 100 1 T126 6 T209 6 T210 2


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
[auto[0]] 0 0 - - - - - -
auto[1] 4364780 0 T29 1559 T25 1362 T126 15



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 4364608 1 T29 1559 T25 1362 T126 6
values[1] 19 1 T209 1 T210 1 T312 2
values[2] 4 1 T126 1 T313 1 T314 1
values[3] 93 1 T126 3 T209 5 T210 1



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 4364575 1 T29 1559 T25 1362 T126 5
values[1] 19 1 T209 2 T233 1 T232 1
values[2] 8 1 T232 1 T312 2 T315 1
values[3] 97 1 T126 6 T209 6 T210 7



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 4364503 1 T29 1559 T25 1362 T118 226
auto[TlIntgErrCmd] 72 1 T126 5 T209 3 T210 1
auto[TlIntgErrData] 105 1 T126 6 T209 5 T210 4
auto[TlIntgErrBoth] 100 1 T126 4 T209 11 T210 3


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
[auto[1]] 0 0 - - - - - -
auto[0] 76495 0 T29 1171 T25 829 T126 1300



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 76290 1 T29 1171 T25 829 T126 1287
values[1] 23 1 T126 1 T209 3 T233 1
values[2] 8 1 T126 1 T316 2 T317 1
values[3] 103 1 T126 7 T209 7 T210 3



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 76292 1 T29 1171 T25 829 T126 1288
values[1] 19 1 T126 2 T209 3 T233 1
values[2] 16 1 T126 1 T209 2 T230 1
values[3] 99 1 T126 6 T209 7 T210 6



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 76195 1 T29 1171 T25 829 T126 1280
auto[TlIntgErrCmd] 97 1 T126 8 T209 4 T210 2
auto[TlIntgErrData] 95 1 T126 7 T209 4 T210 4
auto[TlIntgErrBoth] 108 1 T126 5 T209 12 T210 4

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