Group : spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
dashboard | hierarchy | modlist | groups | tests | asserts


Summary for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 4 0 4 100.00
Crosses 4 0 4 100.00


Variables for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_addr_4b_en 2 0 2 100.00 100 1 1 2
cp_prev_addr_4b_en 2 0 2 100.00 100 1 1 2


Crosses for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 4 0 4 100.00 100 1 1 0


Summary for Variable cp_addr_4b_en

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_addr_4b_en

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 2156 1 T1 4 T8 5 T10 2
auto[1] 2083 1 T1 13 T8 3 T10 7



Summary for Variable cp_prev_addr_4b_en

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_prev_addr_4b_en

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 2165 1 T1 5 T8 4 T10 2
auto[1] 2074 1 T1 12 T8 4 T10 7



Summary for Cross cr_all

Samples crossed: cp_addr_4b_en cp_prev_addr_4b_en
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 4 0 4 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_addr_4b_encp_prev_addr_4b_enCOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] auto[0] 1167 1 T1 2 T8 2 T10 1
auto[0] auto[1] 989 1 T1 2 T8 3 T10 1
auto[1] auto[0] 998 1 T1 3 T8 2 T10 1
auto[1] auto[1] 1085 1 T1 10 T8 1 T10 6

0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100%