Group : spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
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Summary for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

CATEGORY   EXPECTED   UNCOVERED   COVERED   PERCENT   
Variables 4 0 4 100.00
Crosses 4 0 4 100.00


Variables for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
VARIABLE   EXPECTED   UNCOVERED   COVERED   PERCENT   GOAL   WEIGHT   AT LEAST   AUTO BIN MAX   COMMENT   
cp_addr_4b_en 2 0 2 100.00 100 1 1 2
cp_prev_addr_4b_en 2 0 2 100.00 100 1 1 2


Crosses for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 4 0 4 100.00 100 1 1 0


Summary for Variable cp_addr_4b_en

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_addr_4b_en

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 1776 1 T2 4 T6 15 T10 14
auto[1] 1784 1 T2 2 T6 21 T12 13



Summary for Variable cp_prev_addr_4b_en

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_prev_addr_4b_en

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 1798 1 T2 3 T6 16 T10 14
auto[1] 1762 1 T2 3 T6 20 T12 14



Summary for Cross cr_all

Samples crossed: cp_addr_4b_en cp_prev_addr_4b_en
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 4 0 4 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_addr_4b_en   cp_prev_addr_4b_en   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] auto[0] 949 1 T2 1 T6 7 T10 14
auto[0] auto[1] 827 1 T2 3 T6 8 T12 6
auto[1] auto[0] 849 1 T2 2 T6 9 T12 5
auto[1] auto[1] 935 1 T6 12 T12 8 T14 4