Group : spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
dashboard | hierarchy | modlist | groups | tests | asserts


Summary for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 4 0 4 100.00
Crosses 4 0 4 100.00


Variables for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_addr_4b_en 2 0 2 100.00 100 1 1 2
cp_prev_addr_4b_en 2 0 2 100.00 100 1 1 2


Crosses for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 4 0 4 100.00 100 1 1 0


Summary for Variable cp_addr_4b_en

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_addr_4b_en

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 1519 1 T9 7 T10 10 T55 8
auto[1] 1513 1 T9 5 T10 6 T33 2



Summary for Variable cp_prev_addr_4b_en

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_prev_addr_4b_en

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 1516 1 T9 6 T10 9 T55 8
auto[1] 1516 1 T9 6 T10 7 T33 3



Summary for Cross cr_all

Samples crossed: cp_addr_4b_en cp_prev_addr_4b_en
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 4 0 4 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_addr_4b_encp_prev_addr_4b_enCOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] auto[0] 800 1 T9 4 T10 7 T55 8
auto[0] auto[1] 719 1 T9 3 T10 3 T33 2
auto[1] auto[0] 716 1 T9 2 T10 2 T33 1
auto[1] auto[1] 797 1 T9 3 T10 4 T33 1

0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100%