Unified Coverage Report :: Group :: spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

Group : spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_spi_device_env_0.1/spi_device_env_cov.sv

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Summary for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	4	0	4	100.00
Crosses	4	0	4	100.00

Variables for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_addr_4b_en	2	0	2	100.00	100	1	1	2
cp_prev_addr_4b_en	2	0	2	100.00	100	1	1	2

Crosses for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

CROSS	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	PRINT MISSING	COMMENT
cr_all	4	0	4	100.00	100	1	1	0

Summary for Variable cp_addr_4b_en

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_addr_4b_en

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

1534

1

T2

7

T15

4

T16

14

auto[1]

1489

1

T2

12

T16

11

T29

2

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Summary for Variable cp_prev_addr_4b_en

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_prev_addr_4b_en

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

1509

1

T2

7

T15

4

T16

13

auto[1]

1514

1

T2

12

T16

12

T29

1

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Summary for Cross cr_all

Samples crossed: cp_addr_4b_en cp_prev_addr_4b_en

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT	MISSING
Automatically Generated Cross Bins	4	0	4	100.00

Automatically Generated Cross Bins for cr_all

Bins

cp_addr_4b_en

cp_prev_addr_4b_en

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

auto[0]

812

1

T2

4

T15

4

T16

7

auto[0]

auto[1]

722

1

T2

3

T16

7

T44

6

auto[1]

auto[0]

697

1

T2

3

T16

6

T29

1

auto[1]

auto[1]

792

1

T2

9

T16

5

T29

1