Group : spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
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Summary for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 4 0 4 100.00
Crosses 4 0 4 100.00


Variables for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_addr_4b_en 2 0 2 100.00 100 1 1 2
cp_prev_addr_4b_en 2 0 2 100.00 100 1 1 2


Crosses for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 4 0 4 100.00 100 1 1 0


Summary for Variable cp_addr_4b_en

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_addr_4b_en

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 1582 1 T5 9 T6 3 T8 2
auto[1] 1588 1 T5 6 T6 4 T8 2



Summary for Variable cp_prev_addr_4b_en

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_prev_addr_4b_en

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 1586 1 T5 8 T6 4 T8 2
auto[1] 1584 1 T5 7 T6 3 T8 2



Summary for Cross cr_all

Samples crossed: cp_addr_4b_en cp_prev_addr_4b_en
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 4 0 4 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_addr_4b_encp_prev_addr_4b_enCOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] auto[0] 825 1 T5 5 T6 2 T9 3
auto[0] auto[1] 757 1 T5 4 T6 1 T8 2
auto[1] auto[0] 761 1 T5 3 T6 2 T8 2
auto[1] auto[1] 827 1 T5 3 T6 2 T11 5

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