Unified Coverage Report :: Group :: spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

Group : spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_spi_device_env_0.1/spi_device_env_cov.sv

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Summary for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	4	0	4	100.00
Crosses	4	0	4	100.00

Variables for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_addr_4b_en	2	0	2	100.00	100	1	1	2
cp_prev_addr_4b_en	2	0	2	100.00	100	1	1	2

Crosses for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

CROSS	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	PRINT MISSING	COMMENT
cr_all	4	0	4	100.00	100	1	1	0

Summary for Variable cp_addr_4b_en

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_addr_4b_en

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

1314

1

T2

8

T12

8

T14

1

auto[1]

1329

1

T2

7

T12

6

T14

1

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Summary for Variable cp_prev_addr_4b_en

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_prev_addr_4b_en

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

1302

1

T2

8

T12

7

T14

1

auto[1]

1341

1

T2

7

T12

7

T14

1

---

Summary for Cross cr_all

Samples crossed: cp_addr_4b_en cp_prev_addr_4b_en

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT	MISSING
Automatically Generated Cross Bins	4	0	4	100.00

Automatically Generated Cross Bins for cr_all

Bins

cp_addr_4b_en

cp_prev_addr_4b_en

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

auto[0]

668

1

T2

5

T12

5

T15

4

auto[0]

auto[1]

646

1

T2

3

T12

3

T14

1

auto[1]

auto[0]

634

1

T2

3

T12

2

T14

1

auto[1]

auto[1]

695

1

T2

4

T12

4

T27

5