213e792ea
Stage | Name | Tests | Max Job Runtime | Simulated Time | Passing | Total | Pass Rate |
---|---|---|---|---|---|---|---|
V1 | smoke | usbdev_smoke | 0.630s | 1.667us | 0 | 50 | 0.00 |
V1 | csr_hw_reset | usbdev_csr_hw_reset | 0.750s | 39.399us | 5 | 5 | 100.00 |
V1 | csr_rw | usbdev_csr_rw | 1.020s | 54.737us | 20 | 20 | 100.00 |
V1 | csr_bit_bash | usbdev_csr_bit_bash | 13.510s | 10.907ms | 4 | 5 | 80.00 |
V1 | csr_aliasing | usbdev_csr_aliasing | 3.640s | 386.840us | 5 | 5 | 100.00 |
V1 | csr_mem_rw_with_rand_reset | usbdev_csr_mem_rw_with_rand_reset | 4.060s | 128.428us | 20 | 20 | 100.00 |
V1 | regwen_csr_and_corresponding_lockable_csr | usbdev_csr_rw | 1.020s | 54.737us | 20 | 20 | 100.00 |
usbdev_csr_aliasing | 3.640s | 386.840us | 5 | 5 | 100.00 | ||
V1 | mem_walk | usbdev_mem_walk | 3.990s | 488.177us | 5 | 5 | 100.00 |
V1 | mem_partial_access | usbdev_mem_partial_access | 2.330s | 143.909us | 5 | 5 | 100.00 |
V1 | TOTAL | 64 | 115 | 55.65 | |||
V2 | intr_test | usbdev_intr_test | 0.710s | 15.248us | 50 | 50 | 100.00 |
V2 | tl_d_oob_addr_access | usbdev_tl_errors | 2.890s | 308.059us | 20 | 20 | 100.00 |
V2 | tl_d_illegal_access | usbdev_tl_errors | 2.890s | 308.059us | 20 | 20 | 100.00 |
V2 | tl_d_outstanding_access | usbdev_csr_hw_reset | 0.750s | 39.399us | 5 | 5 | 100.00 |
usbdev_csr_rw | 1.020s | 54.737us | 20 | 20 | 100.00 | ||
usbdev_csr_aliasing | 3.640s | 386.840us | 5 | 5 | 100.00 | ||
usbdev_same_csr_outstanding | 9.940s | 10.094ms | 19 | 20 | 95.00 | ||
V2 | tl_d_partial_access | usbdev_csr_hw_reset | 0.750s | 39.399us | 5 | 5 | 100.00 |
usbdev_csr_rw | 1.020s | 54.737us | 20 | 20 | 100.00 | ||
usbdev_csr_aliasing | 3.640s | 386.840us | 5 | 5 | 100.00 | ||
usbdev_same_csr_outstanding | 9.940s | 10.094ms | 19 | 20 | 95.00 | ||
V2 | TOTAL | 89 | 90 | 98.89 | |||
V2S | tl_intg_err | usbdev_sec_cm | 9.980s | 10.005ms | 0 | 5 | 0.00 |
usbdev_tl_intg_err | 10.260s | 10.011ms | 1 | 20 | 5.00 | ||
V2S | sec_cm_bus_integrity | usbdev_tl_intg_err | 10.260s | 10.011ms | 1 | 20 | 5.00 |
V2S | TOTAL | 1 | 25 | 4.00 | |||
V3 | TOTAL | 0 | 0 | -- | |||
Unmapped tests | usbdev_stress_all_with_rand_reset | 9.170s | 10.005ms | 0 | 50 | 0.00 | |
usbdev_stress_all | 0.600s | 0 | 50 | 0.00 | |||
TOTAL | 154 | 330 | 46.67 |
Items | Total | Written | Passing | Progress |
---|---|---|---|---|
N.A. | 2 | 2 | 0 | 0.00 |
V1 | 8 | 8 | 6 | 75.00 |
V2 | 3 | 3 | 2 | 66.67 |
V2S | 2 | 2 | 0 | 0.00 |
SCORE | LINE | COND | TOGGLE | FSM | BRANCH | ASSERT | GROUP |
---|---|---|---|---|---|---|---|
69.62 | 69.25 | 63.91 | 87.42 | 0.00 | 74.05 | 97.77 | 94.98 |
UVM_WARNING [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory.
has 98 failures:
0.usbdev_stress_all_with_rand_reset.358997092
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_stress_all_with_rand_reset/latest/run.log
UVM_WARNING @ 7003208 ps: [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory.
UVM_INFO @ 7003208 ps: (uvm_factory.svh:1645) [UVM/FACTORY/PRINT]
#### Factory Configuration (*)
No instance overrides are registered with this factory
1.usbdev_stress_all_with_rand_reset.3628725184
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/1.usbdev_stress_all_with_rand_reset/latest/run.log
UVM_WARNING @ 2105637 ps: [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory.
UVM_INFO @ 2105637 ps: (uvm_factory.svh:1645) [UVM/FACTORY/PRINT]
#### Factory Configuration (*)
No instance overrides are registered with this factory
... and 46 more failures.
0.usbdev_stress_all.470311152
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_stress_all/latest/run.log
UVM_WARNING @ 0 ps: [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory.
UVM_INFO @ 0 ps: (uvm_factory.svh:1645) [UVM/FACTORY/PRINT]
#### Factory Configuration (*)
No instance overrides are registered with this factory
1.usbdev_stress_all.909461101
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/1.usbdev_stress_all/latest/run.log
UVM_WARNING @ 0 ps: [BDTYP] Cannot create an object of type 'usbdev_stress_all_vseq' because it is not registered with the factory.
UVM_INFO @ 0 ps: (uvm_factory.svh:1645) [UVM/FACTORY/PRINT]
#### Factory Configuration (*)
No instance overrides are registered with this factory
... and 48 more failures.
UVM_ERROR (usbdev_smoke_vseq.sv:12) virtual_sequencer [usbdev_smoke_vseq] FIXME
has 50 failures:
0.usbdev_smoke.789440617
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_smoke/latest/run.log
UVM_ERROR @ 4230946 ps: (usbdev_smoke_vseq.sv:12) uvm_test_top.env.virtual_sequencer [uvm_test_top.env.virtual_sequencer.usbdev_smoke_vseq] FIXME
UVM_INFO @ 4230946 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
1.usbdev_smoke.835801447
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/1.usbdev_smoke/latest/run.log
UVM_ERROR @ 2096415 ps: (usbdev_smoke_vseq.sv:12) uvm_test_top.env.virtual_sequencer [uvm_test_top.env.virtual_sequencer.usbdev_smoke_vseq] FIXME
UVM_INFO @ 2096415 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
... and 48 more failures.
UVM_FATAL (cip_base_vseq.sv:601) [usbdev_common_vseq] timeout wait for alert handshake:fatal_fault
has 14 failures:
0.usbdev_tl_intg_err.3411563161
Line 226, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_tl_intg_err/latest/run.log
UVM_FATAL @ 10010604061 ps: (cip_base_vseq.sv:601) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] timeout wait for alert handshake:fatal_fault
UVM_INFO @ 10010604061 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
1.usbdev_tl_intg_err.129171576
Line 234, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/1.usbdev_tl_intg_err/latest/run.log
UVM_FATAL @ 10034147772 ps: (cip_base_vseq.sv:601) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] timeout wait for alert handshake:fatal_fault
UVM_INFO @ 10034147772 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
... and 8 more failures.
1.usbdev_sec_cm.2490924741
Line 220, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/1.usbdev_sec_cm/latest/run.log
UVM_FATAL @ 10005152611 ps: (cip_base_vseq.sv:601) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] timeout wait for alert handshake:fatal_fault
UVM_INFO @ 10005152611 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
2.usbdev_sec_cm.3276050471
Line 220, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/2.usbdev_sec_cm/latest/run.log
UVM_FATAL @ 10004448405 ps: (cip_base_vseq.sv:601) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] timeout wait for alert handshake:fatal_fault
UVM_INFO @ 10004448405 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
... and 2 more failures.
UVM_ERROR (cip_base_vseq.sv:595) virtual_sequencer [usbdev_common_vseq] expect alert:fatal_fault to fire
has 9 failures:
Test usbdev_sec_cm has 1 failures.
0.usbdev_sec_cm.2192312910
Line 223, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_sec_cm/latest/run.log
UVM_ERROR @ 1651868 ps: (cip_base_vseq.sv:595) uvm_test_top.env.virtual_sequencer [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] expect alert:fatal_fault to fire
UVM_INFO @ 1651868 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
Test usbdev_tl_intg_err has 8 failures.
5.usbdev_tl_intg_err.4087355176
Line 219, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/5.usbdev_tl_intg_err/latest/run.log
UVM_ERROR @ 6712867 ps: (cip_base_vseq.sv:595) uvm_test_top.env.virtual_sequencer [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] expect alert:fatal_fault to fire
UVM_INFO @ 6712867 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
9.usbdev_tl_intg_err.612723133
Line 219, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/9.usbdev_tl_intg_err/latest/run.log
UVM_ERROR @ 7344881 ps: (cip_base_vseq.sv:595) uvm_test_top.env.virtual_sequencer [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] expect alert:fatal_fault to fire
UVM_INFO @ 7344881 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
... and 6 more failures.
UVM_FATAL (cip_base_vseq.sv:99) [usbdev_common_vseq] wait timeout occurred!
has 3 failures:
Test usbdev_tl_intg_err has 1 failures.
7.usbdev_tl_intg_err.2393266031
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/7.usbdev_tl_intg_err/latest/run.log
UVM_FATAL @ 10019913830 ps: (cip_base_vseq.sv:99) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] wait timeout occurred!
UVM_INFO @ 10019913830 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
Test usbdev_stress_all_with_rand_reset has 2 failures.
14.usbdev_stress_all_with_rand_reset.2200590537
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/14.usbdev_stress_all_with_rand_reset/latest/run.log
UVM_FATAL @ 10004852016 ps: (cip_base_vseq.sv:99) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] wait timeout occurred!
UVM_INFO @ 10004852016 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
17.usbdev_stress_all_with_rand_reset.2011425090
Line 215, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/17.usbdev_stress_all_with_rand_reset/latest/run.log
UVM_FATAL @ 10017459450 ps: (cip_base_vseq.sv:99) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] wait timeout occurred!
UVM_INFO @ 10017459450 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
UVM_FATAL (cip_base_vseq.sv:513) [usbdev_common_vseq] timeout occurred!
has 2 failures:
Test usbdev_csr_bit_bash has 1 failures.
0.usbdev_csr_bit_bash.863398238
Line 216, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/0.usbdev_csr_bit_bash/latest/run.log
UVM_FATAL @ 10907056850 ps: (cip_base_vseq.sv:513) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] timeout occurred!
UVM_INFO @ 10907056850 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---
Test usbdev_same_csr_outstanding has 1 failures.
2.usbdev_same_csr_outstanding.3949715479
Line 216, in log /container/opentitan-public/scratch/os_regression/usbdev-sim-vcs/2.usbdev_same_csr_outstanding/latest/run.log
UVM_FATAL @ 10093954817 ps: (cip_base_vseq.sv:513) [uvm_test_top.env.virtual_sequencer.usbdev_common_vseq] timeout occurred!
UVM_INFO @ 10093954817 ps: (uvm_report_catcher.svh:705) [UVM/REPORT/CATCHER]
--- UVM Report catcher Summary ---