Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
92.86 100.00 1 100 1 1 64 64


Source File(s) :
/workspaces/repo/scratch/os_regression_2024_08_24/edn-sim-vcs/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_cgs_wrap[edn_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_cgs_wrap[edn_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[edn_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 1 13 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[edn_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 1 1 50.00 100 0 0 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
[auto[1]] 0 0 - - - - - -
auto[0] 1005119 0 T1 5 T2 113 T3 30



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 1004934 1 T1 5 T2 113 T3 30
values[1] 24 1 T308 2 T309 4 T314 1
values[2] 4 1 T315 1 T316 1 T317 1
values[3] 86 1 T307 6 T308 2 T309 8



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 1004919 1 T1 5 T2 113 T3 30
values[1] 16 1 T307 1 T318 1 T319 1
values[2] 6 1 T307 1 T315 1 T319 1
values[3] 109 1 T307 6 T308 4 T309 12



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 1004819 1 T1 5 T2 113 T3 30
auto[TlIntgErrCmd] 100 1 T307 7 T308 5 T309 7
auto[TlIntgErrData] 115 1 T307 9 T308 3 T309 5
auto[TlIntgErrBoth] 85 1 T307 4 T308 2 T309 8

0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100%