Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

3 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block] 100.00 1 100 1 64 64
tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block] 100.00 1 100 1 64 64
tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 0 14 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 0 2 100.00 100 1 1 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0



Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 1 13 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 1 1 50.00 100 0 0 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0



Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 1 13 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 1 1 50.00 100 0 0 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 23851795 1 T1 20498 T2 3210 T3 10174
auto[1] 4867896 1 T1 4688 T2 213 T3 3844



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 28719497 1 T1 25186 T2 3423 T3 14018
values[1] 17 1 T44 1 T226 1 T227 1
values[2] 7 1 T227 1 T358 1 T269 1
values[3] 103 1 T44 4 T226 6 T227 7



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 28719477 1 T1 25186 T2 3423 T3 14018
values[1] 21 1 T44 1 T226 2 T227 3
values[2] 8 1 T44 1 T297 1 T359 1
values[3] 115 1 T44 3 T226 7 T227 5



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 28719381 1 T1 25186 T2 3423 T3 14018
auto[TlIntgErrCmd] 96 1 T44 3 T226 6 T227 8
auto[TlIntgErrData] 116 1 T44 1 T226 10 T227 6
auto[TlIntgErrBoth] 98 1 T44 6 T226 4 T227 6


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
[auto[0]] 0 0 - - - - - -
auto[1] 4222014 0 T2 18 T3 16922 T4 142



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 4221832 1 T2 18 T3 16922 T4 142
values[1] 19 1 T44 1 T226 1 T227 1
values[2] 5 1 T358 1 T360 1 T269 1
values[3] 95 1 T44 1 T226 10 T227 10



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 4221833 1 T2 18 T3 16922 T4 142
values[1] 22 1 T226 2 T227 1 T361 1
values[2] 6 1 T361 1 T271 1 T362 1
values[3] 88 1 T44 2 T226 5 T227 4



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 4221726 1 T2 18 T3 16922 T4 142
auto[TlIntgErrCmd] 107 1 T44 3 T226 9 T227 10
auto[TlIntgErrData] 106 1 T44 3 T226 8 T227 4
auto[TlIntgErrBoth] 75 1 T44 3 T226 3 T227 4


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
[auto[1]] 0 0 - - - - - -
auto[0] 85687 0 T187 1150 T44 629 T45 42



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 85470 1 T187 1150 T44 621 T45 42
values[1] 20 1 T44 2 T226 1 T227 1
values[2] 6 1 T226 1 T227 1 T360 1
values[3] 115 1 T44 4 T226 7 T227 5



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 85492 1 T187 1150 T44 624 T45 42
values[1] 18 1 T44 1 T226 1 T227 1
values[2] 10 1 T44 1 T359 1 T358 1
values[3] 100 1 T44 1 T226 7 T227 8



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 85377 1 T187 1150 T44 619 T45 42
auto[TlIntgErrCmd] 115 1 T44 5 T226 7 T227 9
auto[TlIntgErrData] 93 1 T44 2 T226 8 T227 6
auto[TlIntgErrBoth] 102 1 T44 3 T226 5 T227 5

0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100%