Unified Coverage Report :: Group :: cip_base_pkg::tl_errors_cg_wrap::tl_errors

Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
100.00	90.37	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

3 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_errors_cgs_wrap[flash_ctrl_eflash_reg_block]	77.78	1	100	1	64	64
tl_errors_cgs_wrap[flash_ctrl_core_reg_block]	93.33	1	100	1	64	64
tl_errors_cgs_wrap[flash_ctrl_prim_reg_block]	100.00	1	100	1	64	64

Group Instance : tl_errors_cgs_wrap[flash_ctrl_eflash_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
77.78	1	100	1	64	64

Summary for Group Instance tl_errors_cgs_wrap[flash_ctrl_eflash_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	15	5	10	77.78

Variables for Group Instance tl_errors_cgs_wrap[flash_ctrl_eflash_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_csr_size_err	2	1	1	50.00	100	0	0	2
cp_instr_type_err	2	0	2	100.00	100	1	1	2
cp_mem_byte_access_err	2	1	1	50.00	100	1	1	2
cp_mem_ro_err	2	0	2	100.00	100	1	1	2
cp_mem_wo_err	2	1	1	50.00	100	0	0	2
cp_tl_protocol_err	1	0	1	100.00	100	1	1	0
cp_unmapped_err	2	1	1	50.00	100	0	0	2
cp_write_w_instr_type_err	2	1	1	50.00	100	1	1	2

Group Instance : tl_errors_cgs_wrap[flash_ctrl_core_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
93.33	1	100	1	64	64

Summary for Group Instance tl_errors_cgs_wrap[flash_ctrl_core_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	15	1	14	93.33

Variables for Group Instance tl_errors_cgs_wrap[flash_ctrl_core_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_csr_size_err	2	0	2	100.00	100	1	1	2
cp_instr_type_err	2	0	2	100.00	100	1	1	2
cp_mem_byte_access_err	2	0	2	100.00	100	1	1	2
cp_mem_ro_err	2	1	1	50.00	100	1	1	2
cp_mem_wo_err	2	0	2	100.00	100	1	1	2
cp_tl_protocol_err	1	0	1	100.00	100	1	1	0
cp_unmapped_err	2	0	2	100.00	100	1	1	2
cp_write_w_instr_type_err	2	0	2	100.00	100	1	1	2

Group Instance : tl_errors_cgs_wrap[flash_ctrl_prim_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

Summary for Group Instance tl_errors_cgs_wrap[flash_ctrl_prim_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	15	3	12	100.00

Variables for Group Instance tl_errors_cgs_wrap[flash_ctrl_prim_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_csr_size_err	2	0	2	100.00	100	1	1	2
cp_instr_type_err	2	0	2	100.00	100	1	1	2
cp_mem_byte_access_err	2	1	1	50.00	100	0	0	2
cp_mem_ro_err	2	1	1	50.00	100	0	0	2
cp_mem_wo_err	2	1	1	50.00	100	0	0	2
cp_tl_protocol_err	1	0	1	100.00	100	1	1	0
cp_unmapped_err	2	0	2	100.00	100	1	1	2
cp_write_w_instr_type_err	2	0	2	100.00	100	1	1	2

Summary for Variable cp_csr_size_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_csr_size_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
[auto[1]]	0	0	-	-	-	-	-	-
auto[0]	2154	0	T36	24	T37	15	T38	36

Summary for Variable cp_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_instr_type_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	1832	1	T177	103	T50	62	T51	5
auto[1]	322	1	T36	24	T37	15	T38	36

Summary for Variable cp_mem_byte_access_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_byte_access_err

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
[auto[1]]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	2154	1		T36	24		T37	15		T38	36

Summary for Variable cp_mem_ro_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_mem_ro_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	2141	1	T36	24	T37	15	T38	36
auto[1]	13	1	T177	1	T178	1	T231	2

Summary for Variable cp_mem_wo_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_wo_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
[auto[1]]	0	0	-	-	-	-	-	-
auto[0]	2154	0	T36	24	T37	15	T38	36

Summary for Variable cp_tl_protocol_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	1	0	1	100.00

User Defined Bins for cp_tl_protocol_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
covered	1704	1		T177	102		T50	62		T51	5

Summary for Variable cp_unmapped_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_unmapped_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
[auto[1]]	0	0	-	-	-	-	-	-
auto[0]	2154	0	T36	24	T37	15	T38	36

Summary for Variable cp_write_w_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_write_w_instr_type_err

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
[auto[1]]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	2154	1		T36	24		T37	15		T38	36

Summary for Variable cp_csr_size_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_csr_size_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	7208	1	T177	388	T50	87	T51	16
auto[1]	1202	1	T177	97	T50	3	T51	2

Summary for Variable cp_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_instr_type_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	6412	1	T177	319	T50	71	T51	12
auto[1]	1998	1	T177	166	T50	19	T51	6

Summary for Variable cp_mem_byte_access_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_mem_byte_access_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	7936	1	T177	459	T50	83	T51	18
auto[1]	474	1	T177	26	T50	7	T178	3

Summary for Variable cp_mem_ro_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_ro_err

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
[auto[1]]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	8410	1		T177	485		T50	90		T51	18

Summary for Variable cp_mem_wo_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_mem_wo_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	8148	1	T177	476	T50	87	T51	17
auto[1]	262	1	T177	9	T50	3	T51	1

Summary for Variable cp_tl_protocol_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	1	0	1	100.00

User Defined Bins for cp_tl_protocol_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
covered	2220	1		T177	29		T50	40		T51	5

Summary for Variable cp_unmapped_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_unmapped_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	8286	1	T177	479	T50	88	T51	18
auto[1]	124	1	T177	6	T50	2	T231	6

Summary for Variable cp_write_w_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_write_w_instr_type_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	6357	1	T177	333	T50	74	T51	14
auto[1]	2053	1	T177	152	T50	16	T51	4

Summary for Variable cp_csr_size_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_csr_size_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	8456	1	T177	621	T50	113	T51	25
auto[1]	635	1	T177	17	T50	10	T51	3

Summary for Variable cp_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_instr_type_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	6911	1	T177	408	T50	98	T51	20
auto[1]	2180	1	T177	230	T50	25	T51	8

Summary for Variable cp_mem_byte_access_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_byte_access_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
[auto[1]]	0	0	-	-	-	-	-	-
auto[0]	9091	0	T177	638	T50	123	T51	28

Summary for Variable cp_mem_ro_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_ro_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
[auto[1]]	0	0	-	-	-	-	-	-
auto[0]	9091	0	T177	638	T50	123	T51	28

Summary for Variable cp_mem_wo_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_wo_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
[auto[1]]	0	0	-	-	-	-	-	-
auto[0]	9091	0	T177	638	T50	123	T51	28

Summary for Variable cp_tl_protocol_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	1	0	1	100.00

User Defined Bins for cp_tl_protocol_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
covered	3662	1		T177	152		T50	63		T51	10

Summary for Variable cp_unmapped_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_unmapped_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	8832	1	T177	621	T50	120	T51	28
auto[1]	259	1	T177	17	T50	3	T178	7

Summary for Variable cp_write_w_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_write_w_instr_type_err

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	6832	1	T177	416	T50	101	T51	21
auto[1]	2259	1	T177	222	T50	22	T51	7