Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
100.00	100.00	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_cgs_wrap[hmac_reg_block]	100.00	1	100	1	64	64

---

Group Instance : tl_intg_err_cgs_wrap[hmac_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[hmac_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	0	14	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[hmac_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	0	2	100.00	100	1	1	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_is_mem

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

54130541

1

T1

25847

T2

16275

T3

11108

auto[1]

20953461

1

T1

15525

T2

22728

T3

7256

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	75083776	1			T1	41372		T2	39003		T3	18364
values[1]	22	1			T50	1		T51	3		T136	1
values[2]	5	1			T56	2		T137	2		T138	1
values[3]	108	1			T49	4		T50	3		T51	3

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	75083772	1			T1	41372		T2	39003		T3	18364
values[1]	25	1			T49	1		T51	3		T136	2
values[2]	10	1			T139	2		T138	1		T140	1
values[3]	113	1			T49	3		T50	6		T51	9

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	75083662	1			T1	41372		T2	39003		T3	18364
auto[TlIntgErrCmd]	110	1			T49	2		T50	3		T51	6
auto[TlIntgErrData]	114	1			T49	4		T50	4		T51	7
auto[TlIntgErrBoth]	116	1			T49	4		T50	3		T51	7