Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
92.86	100.00	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_cgs_wrap[i2c_reg_block]	100.00	1	100	1	64	64

---

Group Instance : tl_intg_err_cgs_wrap[i2c_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[i2c_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	1	13	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[i2c_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	1	1	50.00	100	0	0	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0			-	-		-	-		-	-
auto[0]	32526442	0			T1	174		T2	6080		T3	1738

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	32526267	1			T1	174		T2	6080		T3	1738
values[1]	14	1			T193	1		T194	1		T202	3
values[2]	5	1			T194	1		T261	1		T200	1
values[3]	85	1			T193	7		T194	6		T103	1

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	32526227	1			T1	174		T2	6080		T3	1738
values[1]	29	1			T193	4		T194	1		T103	2
values[2]	9	1			T194	3		T103	1		T262	1
values[3]	100	1			T193	7		T194	9		T103	2

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	32526152	1			T1	174		T2	6080		T3	1738
auto[TlIntgErrCmd]	75	1			T193	3		T194	5		T103	3
auto[TlIntgErrData]	115	1			T193	8		T194	7		T103	3
auto[TlIntgErrBoth]	100	1			T193	9		T194	8		T103	4