Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
100.00	100.00	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_cgs_wrap[kmac_reg_block]	100.00	1	100	1	64	64

---

Group Instance : tl_intg_err_cgs_wrap[kmac_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[kmac_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	0	14	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[kmac_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	0	2	100.00	100	1	1	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_is_mem

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

209720789

1

T1

335464

T2

1278

T3

481824

auto[1]

103348900

1

T1

126691

T2

783

T3

178106

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	313069487	1			T1	462155		T2	2061		T3	659930
values[1]	24	1			T114	1		T116	3		T117	2
values[2]	4	1			T182	1		T183	1		T184	2
values[3]	96	1			T114	2		T116	6		T117	1

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	313069469	1			T1	462155		T2	2061		T3	659930
values[1]	24	1			T116	4		T185	1		T158	1
values[2]	12	1			T116	1		T185	1		T158	1
values[3]	104	1			T114	2		T116	6		T117	3

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	313069369	1			T1	462155		T2	2061		T3	659930
auto[TlIntgErrCmd]	100	1			T114	5		T116	3		T117	1
auto[TlIntgErrData]	118	1			T114	3		T116	9		T117	4
auto[TlIntgErrBoth]	102	1			T114	2		T116	8		T117	5