Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/cover_reg_top/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

2 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_cgs_wrap[rom_ctrl_regs_reg_block] 100.00 1 100 1 64 64
tl_intg_err_cgs_wrap[rom_ctrl_rom_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_cgs_wrap[rom_ctrl_regs_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[rom_ctrl_regs_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 1 13 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[rom_ctrl_regs_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 1 1 50.00 100 0 0 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0



Group Instance : tl_intg_err_cgs_wrap[rom_ctrl_rom_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[rom_ctrl_rom_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 1 13 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[rom_ctrl_rom_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 1 1 50.00 100 0 0 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
[auto[1]] 0 0 - - - - - -
auto[0] 4961158 0 T22 108 T23 20 T24 398



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 4960971 1 T22 108 T23 20 T24 398
values[1] 11 1 T69 1 T71 1 T72 1
values[2] 1 1 T71 1 - - - -
values[3] 102 1 T26 4 T29 5 T68 5



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 4960977 1 T22 108 T23 20 T24 398
values[1] 20 1 T29 1 T68 2 T69 2
values[2] 7 1 T78 1 T116 1 T119 2
values[3] 87 1 T26 2 T29 2 T68 6



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 4960868 1 T22 108 T23 20 T24 398
auto[TlIntgErrCmd] 109 1 T26 6 T29 3 T68 8
auto[TlIntgErrData] 103 1 T26 2 T29 3 T68 10
auto[TlIntgErrBoth] 78 1 T26 2 T29 4 T68 2


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
[auto[0]] 0 0 - - - - - -
auto[1] 6071050 0 T24 40 T25 20 T26 10



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 6070848 1 T24 40 T25 20 T26 1
values[1] 21 1 T26 1 T68 1 T69 2
values[2] 4 1 T68 1 T69 1 T119 1
values[3] 92 1 T26 4 T29 2 T68 5



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 6070860 1 T24 40 T25 20 T26 4
values[1] 21 1 T26 2 T69 2 T71 2
values[2] 10 1 T69 2 T72 1 T78 3
values[3] 89 1 T26 1 T29 2 T68 8



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 6070760 1 T24 40 T25 20 T31 72
auto[TlIntgErrCmd] 100 1 T26 4 T29 6 T68 5
auto[TlIntgErrData] 88 1 T26 1 T29 3 T68 5
auto[TlIntgErrBoth] 102 1 T26 5 T29 1 T68 10

0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100%