Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
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Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
79.17 79.17 1 100 1 1 64 64


Source File(s) :
/workspace/cover_reg_top/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_mem_subword_cgs_wrap[rom_ctrl_rom_reg_block] 79.17 1 100 1 64 64




Group Instance : tl_intg_err_mem_subword_cgs_wrap[rom_ctrl_rom_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
79.17 1 100 1 64 64




Summary for Group Instance tl_intg_err_mem_subword_cgs_wrap[rom_ctrl_rom_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 8 0 8 100.00
Crosses 16 5 11 68.75


Variables for Group Instance tl_intg_err_mem_subword_cgs_wrap[rom_ctrl_rom_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_num_num_enable_bytes 2 0 2 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0
cp_write 2 0 2 100.00 100 1 1 2


Crosses for Group Instance tl_intg_err_mem_subword_cgs_wrap[rom_ctrl_rom_reg_block]
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 16 5 11 68.75 100 1 1 0


Summary for Variable cp_num_num_enable_bytes

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 2 0 2 100.00


User Defined Bins for cp_num_num_enable_bytes

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
partial 40420 1 T24 32 T26 19 T27 19
full_word 16340 1 T23 40 T24 12 T26 1



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 56360 1 T23 40 T24 44 T33 40
auto[TlIntgErrCmd] 120 1 T26 6 T27 6 T44 6
auto[TlIntgErrData] 160 1 T26 8 T27 8 T44 8
auto[TlIntgErrBoth] 120 1 T26 6 T27 6 T44 6



Summary for Variable cp_write

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 23580 1 T23 40 T24 3 T26 9
auto[1] 33180 1 T24 41 T26 11 T27 11



Summary for Cross cr_all

Samples crossed: cp_tl_intg_err_type cp_num_num_enable_bytes cp_write
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 16 5 11 68.75 5


Automatically Generated Cross Bins for cr_all

Element holes
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTNUMBERSTATUS
[auto[TlIntgErrCmd]] [full_word] * -- -- 2
[auto[TlIntgErrBoth]] [full_word] * -- -- 2


Uncovered bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTNUMBERSTATUS
[auto[TlIntgErrData]] [full_word] [auto[1]] 0 1 1


Covered bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] partial auto[0] 17620 1 T24 1 T31 50 T32 50
auto[TlIntgErrNone] partial auto[1] 22420 1 T24 31 T31 1090 T32 1090
auto[TlIntgErrNone] full_word auto[0] 5780 1 T23 40 T24 2 T33 40
auto[TlIntgErrNone] full_word auto[1] 10540 1 T24 10 T31 517 T32 517
auto[TlIntgErrCmd] partial auto[0] 60 1 T26 3 T27 3 T44 3
auto[TlIntgErrCmd] partial auto[1] 60 1 T26 3 T27 3 T44 3
auto[TlIntgErrData] partial auto[0] 60 1 T26 3 T27 3 T44 3
auto[TlIntgErrData] partial auto[1] 80 1 T26 4 T27 4 T44 4
auto[TlIntgErrData] full_word auto[0] 20 1 T26 1 T27 1 T44 1
auto[TlIntgErrBoth] partial auto[0] 40 1 T26 2 T27 2 T44 2
auto[TlIntgErrBoth] partial auto[1] 80 1 T26 4 T27 4 T44 4

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