Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
79.17 79.17 1 100 1 1 64 64


Source File(s) :
/workspace/cover_reg_top/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_mem_subword_cgs_wrap[rom_ctrl_rom_reg_block] 79.17 1 100 1 64 64




Group Instance : tl_intg_err_mem_subword_cgs_wrap[rom_ctrl_rom_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
79.17 1 100 1 64 64




Summary for Group Instance tl_intg_err_mem_subword_cgs_wrap[rom_ctrl_rom_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 8 0 8 100.00
Crosses 16 5 11 68.75


Variables for Group Instance tl_intg_err_mem_subword_cgs_wrap[rom_ctrl_rom_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_num_num_enable_bytes 2 0 2 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0
cp_write 2 0 2 100.00 100 1 1 2


Crosses for Group Instance tl_intg_err_mem_subword_cgs_wrap[rom_ctrl_rom_reg_block]
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 16 5 11 68.75 100 1 1 0


Summary for Variable cp_num_num_enable_bytes

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 2 0 2 100.00


User Defined Bins for cp_num_num_enable_bytes

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
partial 40420 1 T17 19 T21 19 T23 1140
full_word 16340 1 T17 1 T18 40 T20 40



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 56360 1 T18 40 T20 40 T23 1814
auto[TlIntgErrCmd] 120 1 T17 6 T21 6 T47 6
auto[TlIntgErrData] 160 1 T17 8 T21 8 T47 8
auto[TlIntgErrBoth] 120 1 T17 6 T21 6 T47 6



Summary for Variable cp_write

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 23580 1 T17 9 T18 40 T20 40
auto[1] 33180 1 T17 11 T21 11 T23 1607



Summary for Cross cr_all

Samples crossed: cp_tl_intg_err_type cp_num_num_enable_bytes cp_write
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 16 5 11 68.75 5


Automatically Generated Cross Bins for cr_all

Element holes
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTNUMBERSTATUS
[auto[TlIntgErrCmd]] [full_word] * -- -- 2
[auto[TlIntgErrBoth]] [full_word] * -- -- 2


Uncovered bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTNUMBERSTATUS
[auto[TlIntgErrData]] [full_word] [auto[1]] 0 1 1


Covered bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] partial auto[0] 17620 1 T23 50 T24 1 T30 50
auto[TlIntgErrNone] partial auto[1] 22420 1 T23 1090 T24 31 T30 1090
auto[TlIntgErrNone] full_word auto[0] 5780 1 T18 40 T20 40 T23 157
auto[TlIntgErrNone] full_word auto[1] 10540 1 T23 517 T24 10 T30 517
auto[TlIntgErrCmd] partial auto[0] 60 1 T17 3 T21 3 T47 3
auto[TlIntgErrCmd] partial auto[1] 60 1 T17 3 T21 3 T47 3
auto[TlIntgErrData] partial auto[0] 60 1 T17 3 T21 3 T47 3
auto[TlIntgErrData] partial auto[1] 80 1 T17 4 T21 4 T47 4
auto[TlIntgErrData] full_word auto[0] 20 1 T17 1 T21 1 T47 1
auto[TlIntgErrBoth] partial auto[0] 40 1 T17 2 T21 2 T47 2
auto[TlIntgErrBoth] partial auto[1] 80 1 T17 4 T21 4 T47 4

0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100%