Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
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Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

2 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_cgs_wrap[rv_dm_mem_reg_block] 100.00 1 100 1 64 64
tl_intg_err_cgs_wrap[rv_dm_regs_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_cgs_wrap[rv_dm_mem_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[rv_dm_mem_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 0 14 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[rv_dm_mem_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 0 2 100.00 100 1 1 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0



Group Instance : tl_intg_err_cgs_wrap[rv_dm_regs_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[rv_dm_regs_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 1 13 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[rv_dm_regs_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 1 1 50.00 100 0 0 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 765572 1 T6 10 T19 2 T7 47
auto[1] 19408 1 T17 80 T18 80 T43 814



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 784759 1 T17 80 T6 10 T19 2
values[1] 13 1 T40 1 T42 2 T65 1
values[2] 3 1 T42 1 T109 1 T110 1
values[3] 126 1 T40 9 T42 6 T65 4



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 784763 1 T17 80 T6 10 T19 2
values[1] 23 1 T65 2 T111 5 T112 1
values[2] 7 1 T110 2 T113 2 T114 1
values[3] 110 1 T40 6 T42 11 T65 6



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 784640 1 T17 80 T6 10 T19 2
auto[TlIntgErrCmd] 123 1 T40 7 T42 6 T65 4
auto[TlIntgErrData] 119 1 T40 6 T42 8 T65 8
auto[TlIntgErrBoth] 98 1 T40 7 T42 6 T65 8


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
[auto[1]] 0 0 - - - - - -
auto[0] 42659 0 T2 10 T5 21 T37 11



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 42428 1 T2 10 T5 21 T37 11
values[1] 26 1 T42 1 T65 3 T115 1
values[2] 7 1 T42 1 T106 1 T111 1
values[3] 114 1 T40 9 T42 9 T65 4



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 42418 1 T2 10 T5 21 T37 11
values[1] 29 1 T65 6 T115 2 T111 3
values[2] 3 1 T116 1 T117 1 T118 1
values[3] 130 1 T40 7 T42 9 T65 6



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 42319 1 T2 10 T5 21 T37 11
auto[TlIntgErrCmd] 99 1 T40 4 T42 5 T65 6
auto[TlIntgErrData] 109 1 T40 8 T42 5 T65 6
auto[TlIntgErrBoth] 132 1 T40 8 T42 10 T65 8

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