Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
92.86 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_cgs_wrap[rv_timer_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_cgs_wrap[rv_timer_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[rv_timer_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 1 13 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[rv_timer_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 1 1 50.00 100 0 0 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
[auto[1]] 0 0 - - - - - -
auto[0] 132916362 0 T1 3307 T2 38069 T3 2932



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 132916076 1 T1 3307 T2 38069 T3 2932
values[1] 36 1 T28 2 T29 1 T30 2
values[2] 5 1 T95 1 T96 2 T97 1
values[3] 137 1 T28 11 T29 1 T30 10



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 132916078 1 T1 3307 T2 38069 T3 2932
values[1] 32 1 T28 1 T29 1 T30 1
values[2] 9 1 T95 1 T98 1 T99 1
values[3] 148 1 T28 11 T29 3 T30 9



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 132915922 1 T1 3307 T2 38069 T3 2932
auto[TlIntgErrCmd] 156 1 T28 11 T29 3 T30 16
auto[TlIntgErrData] 154 1 T28 9 T29 3 T30 10
auto[TlIntgErrBoth] 130 1 T28 10 T29 4 T30 4

0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100%