Unified Coverage Report :: Group :: spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

Group : spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_spi_device_env_0.1/spi_device_env_cov.sv

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Summary for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	4	0	4	100.00
Crosses	4	0	4	100.00

Variables for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_addr_4b_en	2	0	2	100.00	100	1	1	2
cp_prev_addr_4b_en	2	0	2	100.00	100	1	1	2

Crosses for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

CROSS	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	PRINT MISSING	COMMENT
cr_all	4	0	4	100.00	100	1	1	0

Summary for Variable cp_addr_4b_en

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_addr_4b_en

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

1504

1

T17

2

T26

6

T29

8

auto[1]

1551

1

T26

12

T6

3

T7

3

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Summary for Variable cp_prev_addr_4b_en

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_prev_addr_4b_en

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

1505

1

T17

2

T26

7

T29

7

auto[1]

1550

1

T26

11

T29

1

T6

5

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Summary for Cross cr_all

Samples crossed: cp_addr_4b_en cp_prev_addr_4b_en

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT	MISSING
Automatically Generated Cross Bins	4	0	4	100.00

Automatically Generated Cross Bins for cr_all

Bins

cp_addr_4b_en

cp_prev_addr_4b_en

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

auto[0]

783

1

T17

2

T26

3

T29

7

auto[0]

auto[1]

721

1

T26

3

T29

1

T6

3

auto[1]

auto[0]

722

1

T26

4

T6

1

T7

1

auto[1]

auto[1]

829

1

T26

8

T6

2

T7

2