Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_errors_cgs_wrap[spi_device_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_errors_cgs_wrap[spi_device_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_errors_cgs_wrap[spi_device_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 15 0 15 100.00


Variables for Group Instance tl_errors_cgs_wrap[spi_device_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_csr_size_err 2 0 2 100.00 100 1 1 2
cp_instr_type_err 2 0 2 100.00 100 1 1 2
cp_mem_byte_access_err 2 0 2 100.00 100 1 1 2
cp_mem_ro_err 2 0 2 100.00 100 1 1 2
cp_mem_wo_err 2 0 2 100.00 100 1 1 2
cp_tl_protocol_err 1 0 1 100.00 100 1 1 0
cp_unmapped_err 2 0 2 100.00 100 1 1 2
cp_write_w_instr_type_err 2 0 2 100.00 100 1 1 2


Summary for Variable cp_csr_size_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_csr_size_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 3627 1 T53 4 T54 134 T55 6
auto[1] 1152 1 T54 65 T55 3 T83 1



Summary for Variable cp_instr_type_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_instr_type_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 4190 1 T53 4 T54 162 T55 7
auto[1] 589 1 T54 37 T55 2 T84 8



Summary for Variable cp_mem_byte_access_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_mem_byte_access_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 4358 1 T53 4 T54 185 T55 8
auto[1] 421 1 T54 14 T55 1 T84 3



Summary for Variable cp_mem_ro_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_mem_ro_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 4773 1 T53 4 T54 198 T55 9
auto[1] 6 1 T54 1 T90 1 T93 1



Summary for Variable cp_mem_wo_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_mem_wo_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 4318 1 T53 4 T54 195 T55 9
auto[1] 461 1 T54 4 T87 5 T88 17



Summary for Variable cp_tl_protocol_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 1 0 1 100.00


User Defined Bins for cp_tl_protocol_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
covered 901 1 T54 13 T55 2 T88 62



Summary for Variable cp_unmapped_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_unmapped_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 4600 1 T53 4 T54 193 T55 9
auto[1] 179 1 T54 6 T84 18 T87 3



Summary for Variable cp_write_w_instr_type_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write_w_instr_type_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 3760 1 T53 4 T54 140 T55 8
auto[1] 1019 1 T54 59 T55 1 T83 2

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