Group : spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
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Group : spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64


Source File(s) :
/workspaces/repo/scratch/os_regression/spi_device_2p-sim-vcs/default/sim-vcs/../src/lowrisc_dv_spi_device_env_0.1/spi_device_env_cov.sv


Summary for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg

CATEGORY   EXPECTED   UNCOVERED   COVERED   PERCENT   
Variables 4 0 4 100.00
Crosses 4 0 4 100.00


Variables for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
VARIABLE   EXPECTED   UNCOVERED   COVERED   PERCENT   GOAL   WEIGHT   AT LEAST   AUTO BIN MAX   COMMENT   
cp_addr_4b_en 2 0 2 100.00 100 1 1 2
cp_prev_addr_4b_en 2 0 2 100.00 100 1 1 2


Crosses for Group spi_device_env_pkg::spi_device_env_cov::spi_device_addr_4b_enter_exit_command_cg
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 4 0 4 100.00 100 1 1 0


Summary for Variable cp_addr_4b_en

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_addr_4b_en

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 1460 1 T12 8 T60 4 T46 1
auto[1] 1486 1 T12 4 T46 1 T54 8


Summary for Variable cp_prev_addr_4b_en

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_prev_addr_4b_en

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 1454 1 T12 8 T60 4 T53 5
auto[1] 1492 1 T12 4 T46 2 T226 1


Summary for Cross cr_all

Samples crossed: cp_addr_4b_en cp_prev_addr_4b_en
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 4 0 4 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_addr_4b_en   cp_prev_addr_4b_en   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] auto[0] 736 1 T12 6 T60 4 T53 5
auto[0] auto[1] 724 1 T12 2 T46 1 T226 1
auto[1] auto[0] 718 1 T12 2 T54 5 T50 1
auto[1] auto[1] 768 1 T12 2 T46 1 T54 3