Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
78.57 83.33 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_cgs_wrap[sysrst_ctrl_reg_block] 83.33 1 100 1 64 64




Group Instance : tl_intg_err_cgs_wrap[sysrst_ctrl_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
83.33 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[sysrst_ctrl_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 3 11 83.33


Variables for Group Instance tl_intg_err_cgs_wrap[sysrst_ctrl_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 1 1 50.00 100 0 0 2
cp_num_cmd_err_bits 4 1 3 75.00 100 1 1 0
cp_num_data_err_bits 4 1 3 75.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
[auto[1]] 0 0 - - - - - -
auto[0] 236136 0 T16 739 T17 16 T18 16



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 1 3 75.00


User Defined Bins for cp_num_cmd_err_bits

Uncovered bins
NAMECOUNTAT LEASTNUMBERSTATUS
values[2] 0 1 1


Covered bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 235856 1 T16 739 T17 16 T18 16
values[1] 40 1 T1 2 T5 2 T7 2
values[3] 180 1 T1 9 T5 9 T7 9



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 1 3 75.00


User Defined Bins for cp_num_data_err_bits

Uncovered bins
NAMECOUNTAT LEASTNUMBERSTATUS
values[1] 0 1 1


Covered bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 235896 1 T16 739 T17 16 T18 16
values[2] 20 1 T1 1 T5 1 T7 1
values[3] 140 1 T1 7 T5 7 T7 7



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 235736 1 T16 739 T17 16 T18 16
auto[TlIntgErrCmd] 160 1 T1 8 T5 8 T7 8
auto[TlIntgErrData] 120 1 T1 6 T5 6 T7 6
auto[TlIntgErrBoth] 120 1 T1 6 T5 6 T7 6

0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100%