Group : cip_base_pkg::intr_pins_cg::SHAPE{(num_interrupts - 1)=0}
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Summary for Group cip_base_pkg::intr_pins_cg::SHAPE{(num_interrupts - 1)=0}

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 5 0 5 100.00
Crosses 4 0 4 100.00


Variables for Group cip_base_pkg::intr_pins_cg::SHAPE{(num_interrupts - 1)=0}
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_intr_pin 1 0 1 100.00 100 1 1 0
cp_intr_pin_value 4 0 4 100.00 100 1 1 0


Crosses for Group cip_base_pkg::intr_pins_cg::SHAPE{(num_interrupts - 1)=0}
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cp_intr_pins_all_values 4 0 4 100.00 100 1 1 0


Summary for Variable cp_intr_pin

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 1 0 1 100.00


User Defined Bins for cp_intr_pin

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
all_pins[0] 4602 1 T1 2 T4 2 T2 4



Summary for Variable cp_intr_pin_value

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_intr_pin_value

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0x0] 4425 1 T1 2 T4 2 T2 4
values[0x1] 177 1 T31 2 T32 1 T199 1
transitions[0x0=>0x1] 84 1 T31 1 T32 1 T199 1
transitions[0x1=>0x0] 132 1 T32 1 T199 1 T43 1



Summary for Cross cp_intr_pins_all_values

Samples crossed: cp_intr_pin cp_intr_pin_value
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 4 0 4 100.00


Automatically Generated Cross Bins for cp_intr_pins_all_values

Bins
cp_intr_pincp_intr_pin_valueCOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
all_pins[0] values[0x0] 4425 1 T1 2 T4 2 T2 4
all_pins[0] values[0x1] 177 1 T31 2 T32 1 T199 1
all_pins[0] transitions[0x0=>0x1] 84 1 T31 1 T32 1 T199 1
all_pins[0] transitions[0x1=>0x0] 132 1 T32 1 T199 1 T43 1

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