Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 8 0 8 100.00
Crosses 16 0 16 100.00


Variables for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_num_num_enable_bytes 2 0 2 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0
cp_write 2 0 2 100.00 100 1 1 2


Crosses for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 16 0 16 100.00 100 1 1 0


Summary for Variable cp_num_num_enable_bytes

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 2 0 2 100.00


User Defined Bins for cp_num_num_enable_bytes

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
partial 60085 1 T1 3 T2 8 T3 5
full_word 63149 1 T1 4 T2 4 T3 7



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 123084 1 T1 7 T2 12 T3 12
auto[TlIntgErrCmd] 41 1 T41 2 T115 4 T169 3
auto[TlIntgErrData] 48 1 T41 4 T136 9 T115 2
auto[TlIntgErrBoth] 61 1 T41 4 T136 1 T115 4



Summary for Variable cp_write

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 63473 1 T1 2 T2 4 T3 4
auto[1] 59761 1 T1 5 T2 8 T3 8



Summary for Cross cr_all

Samples crossed: cp_tl_intg_err_type cp_num_num_enable_bytes cp_write
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 16 0 16 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] partial auto[0] 43334 1 T1 1 T2 2 T3 1
auto[TlIntgErrNone] partial auto[1] 16617 1 T1 2 T2 6 T3 4
auto[TlIntgErrNone] full_word auto[0] 20074 1 T1 1 T2 2 T3 3
auto[TlIntgErrNone] full_word auto[1] 43059 1 T1 3 T2 2 T3 4
auto[TlIntgErrCmd] partial auto[0] 17 1 T41 1 T115 2 T169 2
auto[TlIntgErrCmd] partial auto[1] 22 1 T41 1 T115 2 T169 1
auto[TlIntgErrCmd] full_word auto[0] 1 1 T171 1 - - - -
auto[TlIntgErrCmd] full_word auto[1] 1 1 T172 1 - - - -
auto[TlIntgErrData] partial auto[0] 19 1 T41 1 T136 5 T115 1
auto[TlIntgErrData] partial auto[1] 19 1 T41 2 T136 2 T169 1
auto[TlIntgErrData] full_word auto[0] 3 1 T168 1 T173 1 T174 1
auto[TlIntgErrData] full_word auto[1] 7 1 T41 1 T136 2 T115 1
auto[TlIntgErrBoth] partial auto[0] 23 1 T41 1 T115 2 T169 1
auto[TlIntgErrBoth] partial auto[1] 34 1 T41 3 T115 2 T169 3
auto[TlIntgErrBoth] full_word auto[0] 2 1 T172 1 T174 1 - -
auto[TlIntgErrBoth] full_word auto[1] 2 1 T136 1 T173 1 - -

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