Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 8 0 8 100.00
Crosses 16 0 16 100.00


Variables for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_num_num_enable_bytes 2 0 2 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0
cp_write 2 0 2 100.00 100 1 1 2


Crosses for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 16 0 16 100.00 100 1 1 0


Summary for Variable cp_num_num_enable_bytes

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 2 0 2 100.00


User Defined Bins for cp_num_num_enable_bytes

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
partial 73538 1 T1 6 T2 4 T3 3
full_word 65474 1 T1 9 T2 3 T3 6



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 138792 1 T1 15 T2 7 T3 9
auto[TlIntgErrCmd] 71 1 T35 2 T36 11 T57 1
auto[TlIntgErrData] 82 1 T35 4 T36 4 T57 4
auto[TlIntgErrBoth] 67 1 T35 4 T36 5 T57 5



Summary for Variable cp_write

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 73154 1 T1 4 T2 2 T3 4
auto[1] 65858 1 T1 11 T2 5 T3 5



Summary for Cross cr_all

Samples crossed: cp_tl_intg_err_type cp_num_num_enable_bytes cp_write
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 16 0 16 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] partial auto[0] 51308 1 T1 2 T2 2 T4 5
auto[TlIntgErrNone] partial auto[1] 22036 1 T1 4 T2 2 T3 3
auto[TlIntgErrNone] full_word auto[0] 21749 1 T1 2 T3 4 T4 1
auto[TlIntgErrNone] full_word auto[1] 43699 1 T1 7 T2 3 T3 2
auto[TlIntgErrCmd] partial auto[0] 22 1 T35 2 T36 1 T58 1
auto[TlIntgErrCmd] partial auto[1] 38 1 T36 8 T57 1 T58 3
auto[TlIntgErrCmd] full_word auto[0] 7 1 T36 2 T159 1 T163 2
auto[TlIntgErrCmd] full_word auto[1] 4 1 T58 1 T160 1 T164 1
auto[TlIntgErrData] partial auto[0] 39 1 T35 1 T36 2 T58 6
auto[TlIntgErrData] partial auto[1] 34 1 T35 3 T36 1 T57 3
auto[TlIntgErrData] full_word auto[0] 3 1 T58 1 T160 1 T162 1
auto[TlIntgErrData] full_word auto[1] 6 1 T36 1 T57 1 T164 2
auto[TlIntgErrBoth] partial auto[0] 25 1 T35 2 T36 1 T57 2
auto[TlIntgErrBoth] partial auto[1] 36 1 T35 1 T36 2 T57 3
auto[TlIntgErrBoth] full_word auto[0] 1 1 T36 1 - - - -
auto[TlIntgErrBoth] full_word auto[1] 5 1 T35 1 T36 1 T160 1

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