Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 8 0 8 100.00
Crosses 16 0 16 100.00


Variables for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_num_num_enable_bytes 2 0 2 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0
cp_write 2 0 2 100.00 100 1 1 2


Crosses for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 16 0 16 100.00 100 1 1 0


Summary for Variable cp_num_num_enable_bytes

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 2 0 2 100.00


User Defined Bins for cp_num_num_enable_bytes

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
partial 52575 1 T1 3 T2 5 T3 5
full_word 53316 1 T1 6 T2 4 T3 4



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 105731 1 T1 9 T2 9 T3 9
auto[TlIntgErrCmd] 46 1 T137 3 T138 7 T139 4
auto[TlIntgErrData] 46 1 T137 1 T138 6 T139 3
auto[TlIntgErrBoth] 68 1 T137 6 T138 7 T139 3



Summary for Variable cp_write

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 56449 1 T1 4 T2 3 T3 4
auto[1] 49442 1 T1 5 T2 6 T3 5



Summary for Cross cr_all

Samples crossed: cp_tl_intg_err_type cp_num_num_enable_bytes cp_write
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 16 0 16 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] partial auto[0] 36563 1 T1 1 T2 2 T3 2
auto[TlIntgErrNone] partial auto[1] 15865 1 T1 2 T2 3 T3 3
auto[TlIntgErrNone] full_word auto[0] 19814 1 T1 3 T2 1 T3 2
auto[TlIntgErrNone] full_word auto[1] 33489 1 T1 3 T2 3 T3 2
auto[TlIntgErrCmd] partial auto[0] 20 1 T137 1 T138 1 T139 2
auto[TlIntgErrCmd] partial auto[1] 22 1 T137 1 T138 4 T139 2
auto[TlIntgErrCmd] full_word auto[0] 3 1 T137 1 T138 1 T166 1
auto[TlIntgErrCmd] full_word auto[1] 1 1 T138 1 - - - -
auto[TlIntgErrData] partial auto[0] 20 1 T138 2 T139 1 T167 2
auto[TlIntgErrData] partial auto[1] 24 1 T137 1 T138 3 T139 2
auto[TlIntgErrData] full_word auto[0] 1 1 T167 1 - - - -
auto[TlIntgErrData] full_word auto[1] 1 1 T138 1 - - - -
auto[TlIntgErrBoth] partial auto[0] 24 1 T137 1 T138 3 T166 1
auto[TlIntgErrBoth] partial auto[1] 37 1 T137 4 T138 3 T139 2
auto[TlIntgErrBoth] full_word auto[0] 4 1 T138 1 T139 1 T167 1
auto[TlIntgErrBoth] full_word auto[1] 3 1 T137 1 T165 1 T169 1

0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100%