Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
92.86	92.86	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_cgs_wrap[usbdev_reg_block]	92.86	1	100	1	64	64

---

Group Instance : tl_intg_err_cgs_wrap[usbdev_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
92.86	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[usbdev_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	1	13	92.86

Variables for Group Instance tl_intg_err_cgs_wrap[usbdev_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	0	2	100.00	100	1	1	2
cp_num_cmd_err_bits	4	1	3	75.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	109189	1		T1	12		T2	9		T3	984
auto[1]	28127	1		T2	2		T4	2		T21	2

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	1	3	75.00

User Defined Bins for cp_num_cmd_err_bits

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
values[2]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	137253	1		T1	12		T2	11		T3	984
values[1]	7	1		T142	2		T141	1		T212	2
values[3]	31	1		T79	3		T142	1		T141	4

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	137249	1		T1	12		T2	11		T3	984
values[1]	12	1		T79	1		T142	2		T213	1
values[2]	1	1		T214	1		-	-		-	-
values[3]	28	1		T79	5		T142	2		T141	2

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	137216	1		T1	12		T2	11		T3	984
auto[TlIntgErrCmd]	33	1		T79	2		T142	3		T141	5
auto[TlIntgErrData]	37	1		T79	7		T142	3		T141	1
auto[TlIntgErrBoth]	30	1		T79	1		T142	4		T141	4