Unified Coverage Report :: Group :: cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg

Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
80.00	100.00	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_errors_cgs_wrap[usbdev_reg_block]	100.00	1	100	1	64	64

---

Group Instance : tl_errors_cgs_wrap[usbdev_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_errors_cgs_wrap[usbdev_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	15	3	12	100.00

Variables for Group Instance tl_errors_cgs_wrap[usbdev_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_csr_size_err	2	0	2	100.00	100	1	1	2
cp_instr_type_err	2	0	2	100.00	100	1	1	2
cp_mem_byte_access_err	2	1	1	50.00	100	0	0	2
cp_mem_ro_err	2	1	1	50.00	100	0	0	2
cp_mem_wo_err	2	1	1	50.00	100	0	0	2
cp_tl_protocol_err	1	0	1	100.00	100	1	1	0
cp_unmapped_err	2	0	2	100.00	100	1	1	2
cp_write_w_instr_type_err	2	0	2	100.00	100	1	1	2

Summary for Variable cp_csr_size_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_csr_size_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	5657	1		T49	10		T50	178		T51	32
auto[1]	703	1		T49	2		T50	35		T51	2

---

Summary for Variable cp_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	4696	1		T49	9		T50	152		T51	21
auto[1]	1664	1		T49	3		T50	61		T51	13

---

Summary for Variable cp_mem_byte_access_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_byte_access_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	6360	0		T49	12		T50	213		T51	34

---

Summary for Variable cp_mem_ro_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_ro_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	6360	0		T49	12		T50	213		T51	34

---

Summary for Variable cp_mem_wo_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_wo_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	6360	0		T49	12		T50	213		T51	34

---

Summary for Variable cp_tl_protocol_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	1	0	1	100.00

User Defined Bins for cp_tl_protocol_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
covered	1987	1		T49	4		T50	32		T51	3

---

Summary for Variable cp_unmapped_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_unmapped_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	6108	1		T49	12		T50	202		T51	34
auto[1]	252	1		T50	11		T80	1		T161	6

---

Summary for Variable cp_write_w_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_write_w_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	4643	1		T49	9		T50	139		T51	18
auto[1]	1717	1		T49	3		T50	74		T51	16