Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg

Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
100.00	100.00	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]	100.00	1	100	1	64	64

---

Group Instance : tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	8	0	8	100.00
Crosses	16	0	16	100.00

Variables for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_num_num_enable_bytes	2	0	2	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0
cp_write	2	0	2	100.00	100	1	1	2

Crosses for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

CROSS	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	PRINT MISSING	COMMENT
cr_all	16	0	16	100.00	100	1	1	0

Summary for Variable cp_num_num_enable_bytes

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	2	0	2	100.00

User Defined Bins for cp_num_num_enable_bytes

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
partial	89542	1		T1	7		T2	4		T3	5
full_word	61567	1		T1	17		T2	7		T3	6

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	150879	1		T1	24		T2	11		T3	11
auto[TlIntgErrCmd]	75	1		T47	3		T81	2		T186	7
auto[TlIntgErrData]	79	1		T47	2		T49	3		T81	4
auto[TlIntgErrBoth]	76	1		T47	5		T49	7		T81	4

---

Summary for Variable cp_write

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_write

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	65824	1		T1	18		T2	5		T3	4
auto[1]	85285	1		T1	6		T2	6		T3	7

---

Summary for Cross cr_all

Samples crossed: cp_tl_intg_err_type cp_num_num_enable_bytes cp_write

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT	MISSING
Automatically Generated Cross Bins	16	0	16	100.00

Automatically Generated Cross Bins for cr_all

Bins

cp_tl_intg_err_type	cp_num_num_enable_bytes	cp_write	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	partial	auto[0]	41596	1		T1	4		T2	1		T3	2
auto[TlIntgErrNone]	partial	auto[1]	47733	1		T1	3		T2	3		T3	3
auto[TlIntgErrNone]	full_word	auto[0]	24132	1		T1	14		T2	4		T3	2
auto[TlIntgErrNone]	full_word	auto[1]	37418	1		T1	3		T2	3		T3	4
auto[TlIntgErrCmd]	partial	auto[0]	28	1		T186	2		T191	1		T192	2
auto[TlIntgErrCmd]	partial	auto[1]	41	1		T47	3		T81	2		T186	4
auto[TlIntgErrCmd]	full_word	auto[0]	1	1		T186	1		-	-		-	-
auto[TlIntgErrCmd]	full_word	auto[1]	5	1		T259	1		T260	1		T261	2
auto[TlIntgErrData]	partial	auto[0]	39	1		T47	1		T49	2		T81	2
auto[TlIntgErrData]	partial	auto[1]	34	1		T47	1		T81	2		T186	2
auto[TlIntgErrData]	full_word	auto[0]	1	1		T260	1		-	-		-	-
auto[TlIntgErrData]	full_word	auto[1]	5	1		T49	1		T186	1		T192	1
auto[TlIntgErrBoth]	partial	auto[0]	24	1		T47	2		T49	2		T81	2
auto[TlIntgErrBoth]	partial	auto[1]	47	1		T47	3		T49	4		T81	2
auto[TlIntgErrBoth]	full_word	auto[0]	3	1		T49	1		T192	1		T259	1
auto[TlIntgErrBoth]	full_word	auto[1]	2	1		T262	2		-	-		-	-