Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 8 0 8 100.00
Crosses 16 0 16 100.00


Variables for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_num_num_enable_bytes 2 0 2 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0
cp_write 2 0 2 100.00 100 1 1 2


Crosses for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 16 0 16 100.00 100 1 1 0


Summary for Variable cp_num_num_enable_bytes

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 2 0 2 100.00


User Defined Bins for cp_num_num_enable_bytes

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
partial 104855 1 T1 5 T2 1 T3 4
full_word 76560 1 T1 8 T2 6 T3 9



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 181145 1 T1 13 T2 7 T3 13
auto[TlIntgErrCmd] 80 1 T54 3 T61 3 T194 8
auto[TlIntgErrData] 83 1 T54 2 T61 3 T194 6
auto[TlIntgErrBoth] 107 1 T54 5 T61 4 T194 6



Summary for Variable cp_write

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 84254 1 T1 7 T2 2 T3 7
auto[1] 97161 1 T1 6 T2 5 T3 6



Summary for Cross cr_all

Samples crossed: cp_tl_intg_err_type cp_num_num_enable_bytes cp_write
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 16 0 16 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] partial auto[0] 53144 1 T1 3 T3 4 T12 1
auto[TlIntgErrNone] partial auto[1] 51463 1 T1 2 T2 1 T11 3
auto[TlIntgErrNone] full_word auto[0] 30984 1 T1 4 T2 2 T3 3
auto[TlIntgErrNone] full_word auto[1] 45554 1 T1 4 T2 4 T3 6
auto[TlIntgErrCmd] partial auto[0] 37 1 T61 2 T194 4 T246 3
auto[TlIntgErrCmd] partial auto[1] 36 1 T54 2 T61 1 T194 4
auto[TlIntgErrCmd] full_word auto[0] 3 1 T265 1 T269 1 T270 1
auto[TlIntgErrCmd] full_word auto[1] 4 1 T54 1 T250 1 T269 1
auto[TlIntgErrData] partial auto[0] 37 1 T54 1 T61 1 T194 4
auto[TlIntgErrData] partial auto[1] 40 1 T54 1 T61 2 T194 2
auto[TlIntgErrData] full_word auto[0] 3 1 T246 1 T271 1 T269 1
auto[TlIntgErrData] full_word auto[1] 3 1 T197 1 T265 1 T267 1
auto[TlIntgErrBoth] partial auto[0] 42 1 T54 2 T61 3 T194 2
auto[TlIntgErrBoth] partial auto[1] 56 1 T54 3 T194 4 T246 1
auto[TlIntgErrBoth] full_word auto[0] 4 1 T61 1 T266 1 T250 1
auto[TlIntgErrBoth] full_word auto[1] 5 1 T265 2 T266 1 T267 2

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