Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
92.86	92.86	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_cgs_wrap[usbdev_reg_block]	92.86	1	100	1	64	64

---

Group Instance : tl_intg_err_cgs_wrap[usbdev_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
92.86	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[usbdev_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	1	13	92.86

Variables for Group Instance tl_intg_err_cgs_wrap[usbdev_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	0	2	100.00	100	1	1	2
cp_num_cmd_err_bits	4	1	3	75.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	468776	1		T1	10		T2	10		T3	12
auto[1]	368317	1		T2	6		T15	2		T16	1

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	1	3	75.00

User Defined Bins for cp_num_cmd_err_bits

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
values[2]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	836955	1		T1	10		T2	16		T3	12
values[1]	18	1		T58	1		T206	2		T248	2
values[3]	63	1		T58	2		T59	4		T223	6

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	836943	1		T1	10		T2	16		T3	12
values[1]	19	1		T58	2		T206	2		T223	1
values[2]	3	1		T223	1		T205	1		T253	1
values[3]	73	1		T58	3		T59	4		T206	4

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	836873	1		T1	10		T2	16		T3	12
auto[TlIntgErrCmd]	70	1		T58	4		T59	3		T206	3
auto[TlIntgErrData]	82	1		T58	6		T59	5		T206	5
auto[TlIntgErrBoth]	68	1		T59	2		T206	2		T223	4