Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 8 0 8 100.00
Crosses 16 0 16 100.00


Variables for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_num_num_enable_bytes 2 0 2 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0
cp_write 2 0 2 100.00 100 1 1 2


Crosses for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 16 0 16 100.00 100 1 1 0


Summary for Variable cp_num_num_enable_bytes

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 2 0 2 100.00


User Defined Bins for cp_num_num_enable_bytes

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
partial 16102522 1 T1 3701 T2 3702 T3 3566
full_word 9466740 1 T1 14 T2 5 T3 5



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 25568952 1 T1 3715 T2 3707 T3 3571
auto[TlIntgErrCmd] 94 1 T186 4 T187 6 T209 2
auto[TlIntgErrData] 115 1 T186 3 T187 8 T209 5
auto[TlIntgErrBoth] 101 1 T186 3 T187 6 T209 3



Summary for Variable cp_write

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 25180754 1 T1 3706 T2 3698 T3 3560
auto[1] 388508 1 T1 9 T2 9 T3 11



Summary for Cross cr_all

Samples crossed: cp_tl_intg_err_type cp_num_num_enable_bytes cp_write
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 16 0 16 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] partial auto[0] 16007830 1 T1 3695 T2 3698 T3 3559
auto[TlIntgErrNone] partial auto[1] 94400 1 T1 6 T2 4 T3 7
auto[TlIntgErrNone] full_word auto[0] 9172772 1 T1 11 T3 1 T25 2
auto[TlIntgErrNone] full_word auto[1] 293950 1 T1 3 T2 5 T3 4
auto[TlIntgErrCmd] partial auto[0] 38 1 T186 1 T187 3 T280 4
auto[TlIntgErrCmd] partial auto[1] 52 1 T186 2 T187 3 T209 2
auto[TlIntgErrCmd] full_word auto[0] 2 1 T186 1 T287 1 - -
auto[TlIntgErrCmd] full_word auto[1] 2 1 T281 2 - - - -
auto[TlIntgErrData] partial auto[0] 63 1 T186 1 T187 5 T209 4
auto[TlIntgErrData] partial auto[1] 47 1 T186 1 T187 3 T209 1
auto[TlIntgErrData] full_word auto[0] 4 1 T186 1 T287 1 T288 1
auto[TlIntgErrData] full_word auto[1] 1 1 T287 1 - - - -
auto[TlIntgErrBoth] partial auto[0] 40 1 T187 4 T209 1 T280 3
auto[TlIntgErrBoth] partial auto[1] 52 1 T186 3 T187 2 T209 1
auto[TlIntgErrBoth] full_word auto[0] 5 1 T280 2 T289 1 T281 1
auto[TlIntgErrBoth] full_word auto[1] 4 1 T209 1 T280 2 T290 1

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