Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
80.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_errors_cgs_wrap[usbdev_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_errors_cgs_wrap[usbdev_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_errors_cgs_wrap[usbdev_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 15 3 12 100.00


Variables for Group Instance tl_errors_cgs_wrap[usbdev_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_csr_size_err 2 0 2 100.00 100 1 1 2
cp_instr_type_err 2 0 2 100.00 100 1 1 2
cp_mem_byte_access_err 2 1 1 50.00 100 0 0 2
cp_mem_ro_err 2 1 1 50.00 100 0 0 2
cp_mem_wo_err 2 1 1 50.00 100 0 0 2
cp_tl_protocol_err 1 0 1 100.00 100 1 1 0
cp_unmapped_err 2 0 2 100.00 100 1 1 2
cp_write_w_instr_type_err 2 0 2 100.00 100 1 1 2


Summary for Variable cp_csr_size_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_csr_size_err

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 5019 1 T210 3 T211 434 T212 6
auto[1] 847 1 T211 65 T232 17 T233 52



Summary for Variable cp_instr_type_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_instr_type_err

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 4438 1 T210 3 T211 390 T212 6
auto[1] 1428 1 T211 109 T232 76 T233 113



Summary for Variable cp_mem_byte_access_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_mem_byte_access_err

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
[auto[1]] 0 0 - - - - - -
auto[0] 5866 0 T210 3 T211 499 T212 6



Summary for Variable cp_mem_ro_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_mem_ro_err

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
[auto[1]] 0 0 - - - - - -
auto[0] 5866 0 T210 3 T211 499 T212 6



Summary for Variable cp_mem_wo_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_mem_wo_err

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
[auto[1]] 0 0 - - - - - -
auto[0] 5866 0 T210 3 T211 499 T212 6



Summary for Variable cp_tl_protocol_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 1 0 1 100.00


User Defined Bins for cp_tl_protocol_err

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
covered 1834 1 T211 207 T232 61 T233 157



Summary for Variable cp_unmapped_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_unmapped_err

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 5710 1 T210 3 T211 491 T212 6
auto[1] 156 1 T211 8 T232 1 T233 24



Summary for Variable cp_write_w_instr_type_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write_w_instr_type_err

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 4351 1 T210 3 T211 389 T212 6
auto[1] 1515 1 T211 110 T232 70 T233 139

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