Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 8 0 8 100.00
Crosses 16 0 16 100.00


Variables for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_num_num_enable_bytes 2 0 2 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0
cp_write 2 0 2 100.00 100 1 1 2


Crosses for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 16 0 16 100.00 100 1 1 0


Summary for Variable cp_num_num_enable_bytes

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 2 0 2 100.00


User Defined Bins for cp_num_num_enable_bytes

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
partial 14871528 1 T1 76 T2 6 T3 5
full_word 15521041 1 T1 151 T2 5 T3 13



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 30392309 1 T1 227 T2 11 T3 18
auto[TlIntgErrCmd] 90 1 T212 2 T237 3 T244 3
auto[TlIntgErrData] 71 1 T212 2 T237 6 T244 1
auto[TlIntgErrBoth] 99 1 T212 6 T237 1 T244 6



Summary for Variable cp_write

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 29891739 1 T1 150 T2 4 T3 9
auto[1] 500830 1 T1 77 T2 7 T3 9



Summary for Cross cr_all

Samples crossed: cp_tl_intg_err_type cp_num_num_enable_bytes cp_write
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 16 0 16 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] partial auto[0] 14740225 1 T1 43 T2 2 T3 2
auto[TlIntgErrNone] partial auto[1] 131064 1 T1 33 T2 4 T3 3
auto[TlIntgErrNone] full_word auto[0] 15151416 1 T1 107 T2 2 T3 7
auto[TlIntgErrNone] full_word auto[1] 369604 1 T1 44 T2 3 T3 6
auto[TlIntgErrCmd] partial auto[0] 33 1 T237 1 T307 2 T308 2
auto[TlIntgErrCmd] partial auto[1] 49 1 T212 1 T237 2 T244 3
auto[TlIntgErrCmd] full_word auto[0] 2 1 T309 2 - - - -
auto[TlIntgErrCmd] full_word auto[1] 6 1 T212 1 T307 2 T308 1
auto[TlIntgErrData] partial auto[0] 28 1 T212 1 T237 1 T244 1
auto[TlIntgErrData] partial auto[1] 38 1 T212 1 T237 5 T307 2
auto[TlIntgErrData] full_word auto[0] 4 1 T254 1 T314 1 T315 1
auto[TlIntgErrData] full_word auto[1] 1 1 T308 1 - - - -
auto[TlIntgErrBoth] partial auto[0] 29 1 T212 1 T237 1 T244 1
auto[TlIntgErrBoth] partial auto[1] 62 1 T212 5 T244 5 T307 2
auto[TlIntgErrBoth] full_word auto[0] 2 1 T307 1 T309 1 - -
auto[TlIntgErrBoth] full_word auto[1] 6 1 T308 1 T316 1 T317 2

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