Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 8 0 8 100.00
Crosses 16 0 16 100.00


Variables for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_num_num_enable_bytes 2 0 2 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0
cp_write 2 0 2 100.00 100 1 1 2


Crosses for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 16 0 16 100.00 100 1 1 0


Summary for Variable cp_num_num_enable_bytes

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 2 0 2 100.00


User Defined Bins for cp_num_num_enable_bytes

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
partial 14789124 1 T1 8 T2 11 T3 12920
full_word 15564726 1 T1 5 T2 23 T3 13154



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 30353530 1 T1 13 T2 34 T3 26074
auto[TlIntgErrCmd] 112 1 T193 8 T195 4 T217 4
auto[TlIntgErrData] 98 1 T193 6 T195 9 T217 3
auto[TlIntgErrBoth] 110 1 T193 6 T195 7 T217 3



Summary for Variable cp_write

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 29723173 1 T1 4 T2 13 T3 25718
auto[1] 630677 1 T1 9 T2 21 T3 356



Summary for Cross cr_all

Samples crossed: cp_tl_intg_err_type cp_num_num_enable_bytes cp_write
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 16 0 16 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] partial auto[0] 14649675 1 T1 3 T2 4 T3 12815
auto[TlIntgErrNone] partial auto[1] 139152 1 T1 5 T2 7 T3 105
auto[TlIntgErrNone] full_word auto[0] 15073354 1 T1 1 T2 9 T3 12903
auto[TlIntgErrNone] full_word auto[1] 491349 1 T1 4 T2 14 T3 251
auto[TlIntgErrCmd] partial auto[0] 42 1 T193 3 T195 1 T217 2
auto[TlIntgErrCmd] partial auto[1] 65 1 T193 5 T195 3 T217 2
auto[TlIntgErrCmd] full_word auto[0] 4 1 T304 1 T305 1 T306 1
auto[TlIntgErrCmd] full_word auto[1] 1 1 T307 1 - - - -
auto[TlIntgErrData] partial auto[0] 43 1 T193 2 T195 4 T217 1
auto[TlIntgErrData] partial auto[1] 45 1 T193 3 T195 2 T217 2
auto[TlIntgErrData] full_word auto[0] 7 1 T193 1 T195 2 T301 1
auto[TlIntgErrData] full_word auto[1] 3 1 T195 1 T303 1 T308 1
auto[TlIntgErrBoth] partial auto[0] 44 1 T193 1 T195 5 T217 1
auto[TlIntgErrBoth] partial auto[1] 58 1 T193 5 T195 2 T217 2
auto[TlIntgErrBoth] full_word auto[0] 4 1 T300 1 T305 1 T308 1
auto[TlIntgErrBoth] full_word auto[1] 4 1 T301 1 T309 1 T306 1

0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100%