Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 8 0 8 100.00
Crosses 16 0 16 100.00


Variables for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_num_num_enable_bytes 2 0 2 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0
cp_write 2 0 2 100.00 100 1 1 2


Crosses for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 16 0 16 100.00 100 1 1 0


Summary for Variable cp_num_num_enable_bytes

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 2 0 2 100.00


User Defined Bins for cp_num_num_enable_bytes

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
partial 17149733 1 T1 13395 T2 46 T3 2834
full_word 17951109 1 T1 13759 T2 15 T3 1163



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 35100582 1 T1 27154 T2 61 T3 3997
auto[TlIntgErrCmd] 96 1 T189 3 T190 6 T191 3
auto[TlIntgErrData] 87 1 T189 5 T190 2 T191 6
auto[TlIntgErrBoth] 77 1 T189 12 T190 2 T191 1



Summary for Variable cp_write

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 34446087 1 T1 26725 T2 39 T3 3080
auto[1] 654755 1 T1 429 T2 22 T3 917



Summary for Cross cr_all

Samples crossed: cp_tl_intg_err_type cp_num_num_enable_bytes cp_write
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 16 0 16 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] partial auto[0] 17010544 1 T1 13270 T2 36 T3 2788
auto[TlIntgErrNone] partial auto[1] 138944 1 T1 125 T2 10 T3 46
auto[TlIntgErrNone] full_word auto[0] 17435433 1 T1 13455 T2 3 T3 292
auto[TlIntgErrNone] full_word auto[1] 515661 1 T1 304 T2 12 T3 871
auto[TlIntgErrCmd] partial auto[0] 36 1 T190 3 T191 2 T237 2
auto[TlIntgErrCmd] partial auto[1] 54 1 T189 3 T190 3 T191 1
auto[TlIntgErrCmd] full_word auto[0] 1 1 T291 1 - - - -
auto[TlIntgErrCmd] full_word auto[1] 5 1 T292 1 T288 1 T233 1
auto[TlIntgErrData] partial auto[0] 38 1 T189 1 T190 2 T191 4
auto[TlIntgErrData] partial auto[1] 42 1 T189 3 T191 2 T237 5
auto[TlIntgErrData] full_word auto[0] 4 1 T237 2 T268 1 T233 1
auto[TlIntgErrData] full_word auto[1] 3 1 T189 1 T237 1 T289 1
auto[TlIntgErrBoth] partial auto[0] 30 1 T189 5 T190 1 T237 2
auto[TlIntgErrBoth] partial auto[1] 45 1 T189 7 T190 1 T191 1
auto[TlIntgErrBoth] full_word auto[0] 1 1 T293 1 - - - -
auto[TlIntgErrBoth] full_word auto[1] 1 1 T270 1 - - - -

0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100%