Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 8 0 8 100.00
Crosses 16 0 16 100.00


Variables for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_num_num_enable_bytes 2 0 2 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0
cp_write 2 0 2 100.00 100 1 1 2


Crosses for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 16 0 16 100.00 100 1 1 0


Summary for Variable cp_num_num_enable_bytes

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 2 0 2 100.00


User Defined Bins for cp_num_num_enable_bytes

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
partial 16368768 1 T1 5 T2 73 T3 5
full_word 17136690 1 T1 6 T2 16 T3 9



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 33505188 1 T1 11 T2 89 T3 14
auto[TlIntgErrCmd] 90 1 T207 4 T228 5 T234 4
auto[TlIntgErrData] 95 1 T207 7 T234 11 T322 7
auto[TlIntgErrBoth] 85 1 T207 9 T228 5 T234 5



Summary for Variable cp_write

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 32853305 1 T1 2 T2 70 T3 4
auto[1] 652153 1 T1 9 T2 19 T3 10



Summary for Cross cr_all

Samples crossed: cp_tl_intg_err_type cp_num_num_enable_bytes cp_write
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 16 0 16 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] partial auto[0] 16224892 1 T1 1 T2 66 T3 1
auto[TlIntgErrNone] partial auto[1] 143618 1 T1 4 T2 7 T3 4
auto[TlIntgErrNone] full_word auto[0] 16628290 1 T1 1 T2 4 T3 3
auto[TlIntgErrNone] full_word auto[1] 508388 1 T1 5 T2 12 T3 6
auto[TlIntgErrCmd] partial auto[0] 42 1 T207 1 T228 2 T234 1
auto[TlIntgErrCmd] partial auto[1] 42 1 T207 3 T228 1 T234 3
auto[TlIntgErrCmd] full_word auto[0] 4 1 T228 2 T318 1 T323 1
auto[TlIntgErrCmd] full_word auto[1] 2 1 T284 1 T324 1 - -
auto[TlIntgErrData] partial auto[0] 41 1 T207 4 T234 5 T322 2
auto[TlIntgErrData] partial auto[1] 51 1 T207 3 T234 6 T322 5
auto[TlIntgErrData] full_word auto[0] 2 1 T323 1 T325 1 - -
auto[TlIntgErrData] full_word auto[1] 1 1 T326 1 - - - -
auto[TlIntgErrBoth] partial auto[0] 33 1 T207 6 T228 3 T234 1
auto[TlIntgErrBoth] partial auto[1] 49 1 T207 3 T228 2 T234 3
auto[TlIntgErrBoth] full_word auto[0] 1 1 T234 1 - - - -
auto[TlIntgErrBoth] full_word auto[1] 2 1 T284 1 T327 1 - -

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