Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_mem_subword_cg_wrap::tl_intg_err_mem_subword_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 8 0 8 100.00
Crosses 16 0 16 100.00


Variables for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_num_num_enable_bytes 2 0 2 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0
cp_write 2 0 2 100.00 100 1 1 2


Crosses for Group Instance tl_intg_err_mem_subword_cgs_wrap[usbdev_reg_block]
CROSSEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTPRINT MISSINGCOMMENT
cr_all 16 0 16 100.00 100 1 1 0


Summary for Variable cp_num_num_enable_bytes

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 2 0 2 100.00


User Defined Bins for cp_num_num_enable_bytes

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
partial 16413455 1 T1 8 T2 11 T3 7
full_word 17235408 1 T1 4 T2 15 T3 9



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 33648523 1 T1 12 T2 26 T3 16
auto[TlIntgErrCmd] 112 1 T186 5 T189 8 T212 3
auto[TlIntgErrData] 102 1 T186 4 T189 6 T212 3
auto[TlIntgErrBoth] 126 1 T186 11 T189 6 T212 4



Summary for Variable cp_write

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write

Bins
NAMECOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 32960996 1 T1 3 T2 10 T3 7
auto[1] 687867 1 T1 9 T2 16 T3 9



Summary for Cross cr_all

Samples crossed: cp_tl_intg_err_type cp_num_num_enable_bytes cp_write
CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENTMISSING
Automatically Generated Cross Bins 16 0 16 100.00


Automatically Generated Cross Bins for cr_all

Bins
cp_tl_intg_err_typecp_num_num_enable_bytescp_writeCOUNTAT LEASTTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] partial auto[0] 16271994 1 T1 3 T2 8 T3 2
auto[TlIntgErrNone] partial auto[1] 141155 1 T1 5 T2 3 T3 5
auto[TlIntgErrNone] full_word auto[0] 16688853 1 T2 2 T3 5 T29 2
auto[TlIntgErrNone] full_word auto[1] 546521 1 T1 4 T2 13 T3 4
auto[TlIntgErrCmd] partial auto[0] 50 1 T186 3 T189 3 T212 1
auto[TlIntgErrCmd] partial auto[1] 50 1 T186 2 T189 5 T212 2
auto[TlIntgErrCmd] full_word auto[0] 6 1 T235 1 T277 1 T304 2
auto[TlIntgErrCmd] full_word auto[1] 6 1 T308 1 T276 1 T309 1
auto[TlIntgErrData] partial auto[0] 38 1 T186 2 T189 3 T212 1
auto[TlIntgErrData] partial auto[1] 51 1 T186 1 T189 2 T212 1
auto[TlIntgErrData] full_word auto[0] 6 1 T186 1 T277 1 T310 1
auto[TlIntgErrData] full_word auto[1] 7 1 T189 1 T212 1 T309 2
auto[TlIntgErrBoth] partial auto[0] 45 1 T186 6 T212 2 T235 1
auto[TlIntgErrBoth] partial auto[1] 72 1 T186 5 T189 6 T212 1
auto[TlIntgErrBoth] full_word auto[0] 4 1 T224 1 T308 1 T230 1
auto[TlIntgErrBoth] full_word auto[1] 5 1 T212 1 T224 1 T277 1

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