Unified Coverage Report :: Group :: cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg

Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
80.00	100.00	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_errors_cgs_wrap[usbdev_reg_block]	100.00	1	100	1	64	64

---

Group Instance : tl_errors_cgs_wrap[usbdev_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_errors_cgs_wrap[usbdev_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	15	3	12	100.00

Variables for Group Instance tl_errors_cgs_wrap[usbdev_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_csr_size_err	2	0	2	100.00	100	1	1	2
cp_instr_type_err	2	0	2	100.00	100	1	1	2
cp_mem_byte_access_err	2	1	1	50.00	100	0	0	2
cp_mem_ro_err	2	1	1	50.00	100	0	0	2
cp_mem_wo_err	2	1	1	50.00	100	0	0	2
cp_tl_protocol_err	1	0	1	100.00	100	1	1	0
cp_unmapped_err	2	0	2	100.00	100	1	1	2
cp_write_w_instr_type_err	2	0	2	100.00	100	1	1	2

Summary for Variable cp_csr_size_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_csr_size_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	6257	1		T215	9		T216	3		T217	7
auto[1]	917	1		T215	1		T217	2		T244	36

---

Summary for Variable cp_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	5085	1		T215	8		T216	3		T217	7
auto[1]	2089	1		T215	2		T217	2		T244	114

---

Summary for Variable cp_mem_byte_access_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_byte_access_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	7174	0		T215	10		T216	3		T217	9

---

Summary for Variable cp_mem_ro_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_ro_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	7174	0		T215	10		T216	3		T217	9

---

Summary for Variable cp_mem_wo_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_wo_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	7174	0		T215	10		T216	3		T217	9

---

Summary for Variable cp_tl_protocol_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	1	0	1	100.00

User Defined Bins for cp_tl_protocol_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
covered	1654	1		T215	1		T216	2		T217	1

---

Summary for Variable cp_unmapped_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_unmapped_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	6936	1		T215	10		T216	2		T217	9
auto[1]	238	1		T216	1		T244	2		T245	1

---

Summary for Variable cp_write_w_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_write_w_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	4959	1		T215	4		T216	3		T217	5
auto[1]	2215	1		T215	6		T217	4		T244	111