Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_cgs_wrap[usbdev_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_cgs_wrap[usbdev_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[usbdev_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 0 14 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[usbdev_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 0 2 100.00 100 1 1 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 18794710 1 T1 63707 T2 92 T3 17
auto[1] 926244 1 T2 27 T3 13 T27 870



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 19720778 1 T1 63707 T2 119 T3 30
values[1] 24 1 T220 1 T257 1 T260 2
values[2] 3 1 T257 1 T508 1 T509 1
values[3] 90 1 T220 4 T257 5 T510 4



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 19720777 1 T1 63707 T2 119 T3 30
values[1] 17 1 T220 1 T257 3 T511 1
values[2] 7 1 T510 1 T512 2 T513 1
values[3] 85 1 T220 3 T257 4 T260 3



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 19720674 1 T1 63707 T2 119 T3 30
auto[TlIntgErrCmd] 103 1 T220 4 T257 7 T260 2
auto[TlIntgErrData] 104 1 T220 2 T257 9 T260 4
auto[TlIntgErrBoth] 73 1 T220 4 T257 4 T260 4

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