Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
80.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspaces/repo/scratch/os_regression_2024_10_14/usbdev-sim-vcs/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_errors_cgs_wrap[usbdev_reg_block] 100.00 1 100 1 64 64



Group Instance : tl_errors_cgs_wrap[usbdev_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64



Summary for Group Instance tl_errors_cgs_wrap[usbdev_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 15 3 12 100.00


Variables for Group Instance tl_errors_cgs_wrap[usbdev_reg_block]
VARIABLE   EXPECTED   UNCOVERED   COVERED   PERCENT   GOAL   WEIGHT   AT LEAST   AUTO BIN MAX   COMMENT   
cp_csr_size_err 2 0 2 100.00 100 1 1 2
cp_instr_type_err 2 0 2 100.00 100 1 1 2
cp_mem_byte_access_err 2 1 1 50.00 100 0 0 2
cp_mem_ro_err 2 1 1 50.00 100 0 0 2
cp_mem_wo_err 2 1 1 50.00 100 0 0 2
cp_tl_protocol_err 1 0 1 100.00 100 1 1 0
cp_unmapped_err 2 0 2 100.00 100 1 1 2
cp_write_w_instr_type_err 2 0 2 100.00 100 1 1 2


Summary for Variable cp_csr_size_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_csr_size_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 5555 1 T200 56 T201 8 T202 2
auto[1] 981 1 T200 26 T223 2 T232 28


Summary for Variable cp_instr_type_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_instr_type_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 4832 1 T200 61 T201 4 T202 2
auto[1] 1704 1 T200 21 T201 4 T223 4


Summary for Variable cp_mem_byte_access_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_mem_byte_access_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
[auto[1]] 0 0 - - - - - -
auto[0] 6536 0 T200 82 T201 8 T202 2


Summary for Variable cp_mem_ro_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_mem_ro_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
[auto[1]] 0 0 - - - - - -
auto[0] 6536 0 T200 82 T201 8 T202 2


Summary for Variable cp_mem_wo_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_mem_wo_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
[auto[1]] 0 0 - - - - - -
auto[0] 6536 0 T200 82 T201 8 T202 2


Summary for Variable cp_tl_protocol_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 1 0 1 100.00


User Defined Bins for cp_tl_protocol_err

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
covered 1732 1 T200 7 T201 2 T223 3


Summary for Variable cp_unmapped_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_unmapped_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 6329 1 T200 77 T201 8 T202 2
auto[1] 207 1 T200 5 T223 1 T232 6


Summary for Variable cp_write_w_instr_type_err

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_write_w_instr_type_err

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[0] 4742 1 T200 59 T201 6 T202 2
auto[1] 1794 1 T200 23 T201 2 T223 3