Unified Coverage Report :: Group :: cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg

Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
100.00	90.37	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

3 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_errors_cgs_wrap[flash_ctrl_eflash_reg_block]	77.78	1	100	1	64	64
tl_errors_cgs_wrap[flash_ctrl_core_reg_block]	93.33	1	100	1	64	64
tl_errors_cgs_wrap[flash_ctrl_prim_reg_block]	100.00	1	100	1	64	64

---

Group Instance : tl_errors_cgs_wrap[flash_ctrl_eflash_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
77.78	1	100	1	64	64

---

Summary for Group Instance tl_errors_cgs_wrap[flash_ctrl_eflash_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	15	5	10	77.78

Variables for Group Instance tl_errors_cgs_wrap[flash_ctrl_eflash_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_csr_size_err	2	1	1	50.00	100	0	0	2
cp_instr_type_err	2	0	2	100.00	100	1	1	2
cp_mem_byte_access_err	2	1	1	50.00	100	1	1	2
cp_mem_ro_err	2	0	2	100.00	100	1	1	2
cp_mem_wo_err	2	1	1	50.00	100	0	0	2
cp_tl_protocol_err	1	0	1	100.00	100	1	1	0
cp_unmapped_err	2	1	1	50.00	100	0	0	2
cp_write_w_instr_type_err	2	1	1	50.00	100	1	1	2

---

Group Instance : tl_errors_cgs_wrap[flash_ctrl_core_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
93.33	1	100	1	64	64

---

Summary for Group Instance tl_errors_cgs_wrap[flash_ctrl_core_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	15	1	14	93.33

Variables for Group Instance tl_errors_cgs_wrap[flash_ctrl_core_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_csr_size_err	2	0	2	100.00	100	1	1	2
cp_instr_type_err	2	0	2	100.00	100	1	1	2
cp_mem_byte_access_err	2	0	2	100.00	100	1	1	2
cp_mem_ro_err	2	1	1	50.00	100	1	1	2
cp_mem_wo_err	2	0	2	100.00	100	1	1	2
cp_tl_protocol_err	1	0	1	100.00	100	1	1	0
cp_unmapped_err	2	0	2	100.00	100	1	1	2
cp_write_w_instr_type_err	2	0	2	100.00	100	1	1	2

---

Group Instance : tl_errors_cgs_wrap[flash_ctrl_prim_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_errors_cgs_wrap[flash_ctrl_prim_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	15	3	12	100.00

Variables for Group Instance tl_errors_cgs_wrap[flash_ctrl_prim_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_csr_size_err	2	0	2	100.00	100	1	1	2
cp_instr_type_err	2	0	2	100.00	100	1	1	2
cp_mem_byte_access_err	2	1	1	50.00	100	0	0	2
cp_mem_ro_err	2	1	1	50.00	100	0	0	2
cp_mem_wo_err	2	1	1	50.00	100	0	0	2
cp_tl_protocol_err	1	0	1	100.00	100	1	1	0
cp_unmapped_err	2	0	2	100.00	100	1	1	2
cp_write_w_instr_type_err	2	0	2	100.00	100	1	1	2

Summary for Variable cp_csr_size_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_csr_size_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	1987	0		T53	72		T54	64		T55	117

---

Summary for Variable cp_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	1451	1		T227	105		T75	35		T76	9
auto[1]	536	1		T53	72		T54	64		T55	117

---

Summary for Variable cp_mem_byte_access_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_byte_access_err

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
[auto[1]]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	1987	1		T53	72		T54	64		T55	117

---

Summary for Variable cp_mem_ro_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_mem_ro_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	1980	1		T53	72		T54	64		T55	117
auto[1]	7	1		T279	1		T287	1		T286	2

---

Summary for Variable cp_mem_wo_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_wo_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	1987	0		T53	72		T54	64		T55	117

---

Summary for Variable cp_tl_protocol_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	1	0	1	100.00

User Defined Bins for cp_tl_protocol_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
covered	1314	1		T227	105		T75	35		T235	58

---

Summary for Variable cp_unmapped_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_unmapped_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	1987	0		T53	72		T54	64		T55	117

---

Summary for Variable cp_write_w_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_write_w_instr_type_err

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
[auto[1]]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	1987	1		T53	72		T54	64		T55	117

Summary for Variable cp_csr_size_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_csr_size_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	6333	1		T227	312		T75	37		T76	4
auto[1]	1400	1		T227	85		T235	62		T251	2

---

Summary for Variable cp_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	5813	1		T227	279		T75	17		T76	4
auto[1]	1920	1		T227	118		T75	20		T235	50

---

Summary for Variable cp_mem_byte_access_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_mem_byte_access_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	7433	1		T227	379		T75	31		T76	4
auto[1]	300	1		T227	18		T75	6		T235	29

---

Summary for Variable cp_mem_ro_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_ro_err

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
[auto[1]]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	7733	1		T227	397		T75	37		T76	4

---

Summary for Variable cp_mem_wo_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_mem_wo_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	7521	1		T227	390		T75	36		T76	4
auto[1]	212	1		T227	7		T75	1		T235	5

---

Summary for Variable cp_tl_protocol_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	1	0	1	100.00

User Defined Bins for cp_tl_protocol_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
covered	1806	1		T227	49		T75	1		T235	12

---

Summary for Variable cp_unmapped_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_unmapped_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	7546	1		T227	391		T75	37		T76	4
auto[1]	187	1		T227	6		T235	3		T248	1

---

Summary for Variable cp_write_w_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_write_w_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	5904	1		T227	283		T75	28		T76	4
auto[1]	1829	1		T227	114		T75	9		T235	35

Summary for Variable cp_csr_size_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_csr_size_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	7761	1		T227	441		T75	160		T76	6
auto[1]	503	1		T227	27		T75	15		T235	8

---

Summary for Variable cp_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	6119	1		T227	314		T75	128		T76	6
auto[1]	2145	1		T227	154		T75	47		T235	32

---

Summary for Variable cp_mem_byte_access_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_byte_access_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	8264	0		T227	468		T75	175		T76	6

---

Summary for Variable cp_mem_ro_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_ro_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	8264	0		T227	468		T75	175		T76	6

---

Summary for Variable cp_mem_wo_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_wo_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	8264	0		T227	468		T75	175		T76	6

---

Summary for Variable cp_tl_protocol_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	1	0	1	100.00

User Defined Bins for cp_tl_protocol_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
covered	3094	1		T227	117		T75	55		T235	86

---

Summary for Variable cp_unmapped_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_unmapped_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	7980	1		T227	456		T75	168		T76	6
auto[1]	284	1		T227	12		T75	7		T235	22

---

Summary for Variable cp_write_w_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_write_w_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	6103	1		T227	310		T75	124		T76	6
auto[1]	2161	1		T227	158		T75	51		T235	36