Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
100.00	97.22	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

3 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]	91.67	1	100	1	64	64
tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]	100.00	1	100	1	64	64
tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]	100.00	1	100	1	64	64

---

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
91.67	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	2	12	91.67

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	1	1	50.00	100	0	0	2
cp_num_cmd_err_bits	4	1	3	75.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

---

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	0	14	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	0	2	100.00	100	1	1	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

---

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	1	13	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	1	1	50.00	100	0	0	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[0]]	0	0		-	-		-	-		-	-
auto[1]	4001932	0		T5	41477		T7	16360		T8	16034

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	1	3	75.00

User Defined Bins for cp_num_cmd_err_bits

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
values[2]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	4001774	1		T5	41477		T7	16360		T8	16034
values[1]	14	1		T103	1		T240	2		T242	1
values[3]	78	1		T103	5		T232	3		T240	2

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	4001752	1		T5	41477		T7	16360		T8	16034
values[1]	24	1		T103	1		T232	2		T242	1
values[2]	4	1		T239	1		T267	1		T347	1
values[3]	97	1		T103	2		T232	3		T240	6

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	4001676	1		T5	41477		T7	16360		T8	16034
auto[TlIntgErrCmd]	76	1		T103	7		T232	2		T240	1
auto[TlIntgErrData]	98	1		T103	2		T232	2		T240	5
auto[TlIntgErrBoth]	82	1		T103	1		T232	6		T240	3

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	28608713	1		T1	165		T2	161		T3	12569
auto[1]	5588419	1		T3	7996		T4	21735		T5	15917

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	34196964	1		T1	165		T2	161		T3	20565
values[1]	19	1		T232	1		T240	1		T239	1
values[2]	2	1		T348	2		-	-		-	-
values[3]	81	1		T103	4		T232	3		T240	3

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	34196948	1		T1	165		T2	161		T3	20565
values[1]	19	1		T103	2		T240	2		T239	2
values[2]	6	1		T232	1		T243	1		T241	1
values[3]	98	1		T103	4		T232	5		T240	2

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	34196862	1		T1	165		T2	161		T3	20565
auto[TlIntgErrCmd]	86	1		T103	3		T232	2		T240	5
auto[TlIntgErrData]	102	1		T103	4		T232	5		T240	3
auto[TlIntgErrBoth]	82	1		T103	3		T232	3		T240	2

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	82813	0		T69	621		T100	1193		T101	123

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	82636	1		T69	621		T100	1193		T101	123
values[1]	21	1		T240	1		T239	2		T242	3
values[2]	2	1		T103	1		T242	1		-	-
values[3]	92	1		T103	3		T232	5		T240	4

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	82633	1		T69	621		T100	1193		T101	123
values[1]	19	1		T232	1		T242	3		T243	2
values[2]	11	1		T232	1		T242	2		T241	1
values[3]	87	1		T103	1		T232	4		T240	4

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	82543	1		T69	621		T100	1193		T101	123
auto[TlIntgErrCmd]	90	1		T103	6		T232	3		T240	6
auto[TlIntgErrData]	93	1		T103	1		T232	5		T240	3
auto[TlIntgErrBoth]	87	1		T103	3		T232	2		T240	1