Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
100.00	100.00	1	100	1	1	64	64

Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

3 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]	100.00	1	100	1	64	64
tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]	100.00	1	100	1	64	64
tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]	100.00	1	100	1	64	64

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	0	14	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_core_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	0	2	100.00	100	1	1	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	1	13	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_eflash_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	1	1	50.00	100	0	0	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Group Instance : tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

Summary for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	1	13	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[flash_ctrl_prim_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	1	1	50.00	100	0	0	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[0]	27011370	1	T1	384	T2	12145	T3	243
auto[1]	5332193	1	T1	37	T2	7750	T4	26672

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
values[0]	32343374	1	T1	421	T2	19895	T3	243
values[1]	20	1	T124	2	T209	1	T210	1
values[2]	3	1	T339	1	T340	1	T341	1
values[3]	94	1	T124	5	T209	1	T210	7

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
values[0]	32343384	1	T1	421	T2	19895	T3	243
values[1]	20	1	T297	2	T277	1	T252	2
values[2]	5	1	T124	1	T210	1	T339	1
values[3]	81	1	T124	1	T209	7	T210	6

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[TlIntgErrNone]	32343293	1	T1	421	T2	19895	T3	243
auto[TlIntgErrCmd]	91	1	T124	7	T210	5	T297	5
auto[TlIntgErrData]	81	1	T124	1	T209	5	T210	4
auto[TlIntgErrBoth]	98	1	T124	2	T209	5	T210	11

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
[auto[0]]	0	0	-	-	-	-	-	-
auto[1]	3770504	0	T4	16377	T6	16072	T7	9329

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
values[0]	3770352	1	T4	16377	T6	16072	T7	9329
values[1]	21	1	T209	2	T210	1	T297	1
values[2]	4	1	T124	1	T342	1	T343	1
values[3]	69	1	T124	2	T210	4	T297	3

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
values[0]	3770328	1	T4	16377	T6	16072	T7	9329
values[1]	13	1	T124	1	T209	1	T210	2
values[2]	8	1	T277	1	T344	1	T339	2
values[3]	92	1	T124	2	T209	4	T210	5

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[TlIntgErrNone]	3770256	1	T4	16377	T6	16072	T7	9329
auto[TlIntgErrCmd]	72	1	T124	5	T209	1	T210	6
auto[TlIntgErrData]	96	1	T124	4	T209	5	T210	8
auto[TlIntgErrBoth]	80	1	T209	3	T210	5	T277	5

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
[auto[1]]	0	0	-	-	-	-	-	-
auto[0]	81093	0	T70	2358	T122	727	T123	526

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
values[0]	80896	1	T70	2358	T122	727	T123	526
values[1]	20	1	T124	1	T210	1	T277	2
values[2]	5	1	T344	1	T343	1	T345	1
values[3]	97	1	T124	4	T209	6	T210	3

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
values[0]	80920	1	T70	2358	T122	727	T123	526
values[1]	20	1	T209	2	T210	3	T277	3
values[2]	8	1	T252	1	T344	1	T339	1
values[3]	76	1	T124	4	T210	9	T297	3

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST	TEST	COUNT	TEST	COUNT	TEST	COUNT
auto[TlIntgErrNone]	80823	1	T70	2358	T122	727	T123	526
auto[TlIntgErrCmd]	97	1	T124	2	T209	7	T210	7
auto[TlIntgErrData]	73	1	T124	2	T209	1	T210	4
auto[TlIntgErrBoth]	100	1	T124	6	T209	2	T210	9