Unified Coverage Report :: Group :: cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg

Group : cip_base_pkg::tl_errors_cg_wrap::tl_errors_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
100.00	92.59	1	100	1	1	64	64

Source File(s) :
/workspaces/lowrisc/opentitan/scratch/earlgrey_1_0_0_2024_08_20_RC0/flash_ctrl-sim-vcs/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

3 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_errors_cgs_wrap[flash_ctrl_eflash_reg_block]	77.78	1	100	1	64	64
tl_errors_cgs_wrap[flash_ctrl_core_reg_block]	100.00	1	100	1	64	64
tl_errors_cgs_wrap[flash_ctrl_prim_reg_block]	100.00	1	100	1	64	64

---

Group Instance : tl_errors_cgs_wrap[flash_ctrl_eflash_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
77.78	1	100	1	64	64

---

Summary for Group Instance tl_errors_cgs_wrap[flash_ctrl_eflash_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	15	5	10	77.78

Variables for Group Instance tl_errors_cgs_wrap[flash_ctrl_eflash_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_csr_size_err	2	1	1	50.00	100	0	0	2
cp_instr_type_err	2	0	2	100.00	100	1	1	2
cp_mem_byte_access_err	2	1	1	50.00	100	1	1	2
cp_mem_ro_err	2	0	2	100.00	100	1	1	2
cp_mem_wo_err	2	1	1	50.00	100	0	0	2
cp_tl_protocol_err	1	0	1	100.00	100	1	1	0
cp_unmapped_err	2	1	1	50.00	100	0	0	2
cp_write_w_instr_type_err	2	1	1	50.00	100	1	1	2

---

Group Instance : tl_errors_cgs_wrap[flash_ctrl_core_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_errors_cgs_wrap[flash_ctrl_core_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	15	0	15	100.00

Variables for Group Instance tl_errors_cgs_wrap[flash_ctrl_core_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_csr_size_err	2	0	2	100.00	100	1	1	2
cp_instr_type_err	2	0	2	100.00	100	1	1	2
cp_mem_byte_access_err	2	0	2	100.00	100	1	1	2
cp_mem_ro_err	2	0	2	100.00	100	1	1	2
cp_mem_wo_err	2	0	2	100.00	100	1	1	2
cp_tl_protocol_err	1	0	1	100.00	100	1	1	0
cp_unmapped_err	2	0	2	100.00	100	1	1	2
cp_write_w_instr_type_err	2	0	2	100.00	100	1	1	2

---

Group Instance : tl_errors_cgs_wrap[flash_ctrl_prim_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_errors_cgs_wrap[flash_ctrl_prim_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	15	3	12	100.00

Variables for Group Instance tl_errors_cgs_wrap[flash_ctrl_prim_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_csr_size_err	2	0	2	100.00	100	1	1	2
cp_instr_type_err	2	0	2	100.00	100	1	1	2
cp_mem_byte_access_err	2	1	1	50.00	100	0	0	2
cp_mem_ro_err	2	1	1	50.00	100	0	0	2
cp_mem_wo_err	2	1	1	50.00	100	0	0	2
cp_tl_protocol_err	1	0	1	100.00	100	1	1	0
cp_unmapped_err	2	0	2	100.00	100	1	1	2
cp_write_w_instr_type_err	2	0	2	100.00	100	1	1	2

Summary for Variable cp_csr_size_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_csr_size_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	1816	0		T2	27		T52	55		T59	42

---

Summary for Variable cp_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	1436	1		T114	49		T73	16		T117	47
auto[1]	380	1		T2	27		T52	55		T59	42

---

Summary for Variable cp_mem_byte_access_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_byte_access_err

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
[auto[1]]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	1816	1		T2	27		T52	55		T59	42

---

Summary for Variable cp_mem_ro_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_mem_ro_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	1808	1		T2	27		T52	55		T59	42
auto[1]	8	1		T225	1		T260	1		T263	2

---

Summary for Variable cp_mem_wo_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_wo_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	1816	0		T2	27		T52	55		T59	42

---

Summary for Variable cp_tl_protocol_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	1	0	1	100.00

User Defined Bins for cp_tl_protocol_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
covered	1316	1		T114	49		T73	16		T117	47

---

Summary for Variable cp_unmapped_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_unmapped_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	1816	0		T2	27		T52	55		T59	42

---

Summary for Variable cp_write_w_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_write_w_instr_type_err

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER
[auto[1]]	0	1	1

Covered bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	1816	1		T2	27		T52	55		T59	42

Summary for Variable cp_csr_size_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_csr_size_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	6304	1		T114	64		T73	55		T117	251
auto[1]	1289	1		T114	23		T73	2		T117	33

---

Summary for Variable cp_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	5767	1		T114	87		T73	31		T117	169
auto[1]	1826	1		T73	26		T117	115		T115	2

---

Summary for Variable cp_mem_byte_access_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_mem_byte_access_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	7265	1		T114	81		T73	56		T117	278
auto[1]	328	1		T114	6		T73	1		T117	6

---

Summary for Variable cp_mem_ro_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_mem_ro_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	7585	1		T114	87		T73	57		T117	284
auto[1]	8	1		T238	1		T260	2		T265	1

---

Summary for Variable cp_mem_wo_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_mem_wo_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	7088	1		T114	87		T73	57		T117	284
auto[1]	505	1		T115	1		T225	37		T226	28

---

Summary for Variable cp_tl_protocol_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	1	0	1	100.00

User Defined Bins for cp_tl_protocol_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
covered	1569	1		T114	55		T73	3		T117	17

---

Summary for Variable cp_unmapped_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_unmapped_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	7489	1		T114	84		T73	57		T117	277
auto[1]	104	1		T114	3		T117	7		T225	9

---

Summary for Variable cp_write_w_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_write_w_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	5720	1		T114	87		T73	32		T117	178
auto[1]	1873	1		T73	25		T117	106		T115	2

Summary for Variable cp_csr_size_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_csr_size_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	7705	1		T114	262		T73	91		T117	320
auto[1]	555	1		T114	8		T73	3		T117	11

---

Summary for Variable cp_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	5920	1		T114	176		T73	67		T117	239
auto[1]	2340	1		T114	94		T73	27		T117	92

---

Summary for Variable cp_mem_byte_access_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_byte_access_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	8260	0		T114	270		T73	94		T117	331

---

Summary for Variable cp_mem_ro_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_ro_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	8260	0		T114	270		T73	94		T117	331

---

Summary for Variable cp_mem_wo_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_mem_wo_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0		-	-		-	-		-	-
auto[0]	8260	0		T114	270		T73	94		T117	331

---

Summary for Variable cp_tl_protocol_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	1	0	1	100.00

User Defined Bins for cp_tl_protocol_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
covered	2715	1		T114	92		T73	33		T117	121

---

Summary for Variable cp_unmapped_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_unmapped_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	8009	1		T114	261		T73	93		T117	328
auto[1]	251	1		T114	9		T73	1		T117	3

---

Summary for Variable cp_write_w_instr_type_err

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_write_w_instr_type_err

Bins

NAME	COUNT	AT LEAST		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[0]	5932	1		T114	203		T73	64		T117	227
auto[1]	2328	1		T114	67		T73	30		T117	104