Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
dashboard | hierarchy | modlist | groups | tests | asserts

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
92.86 100.00 1 100 1 1 64 64


Source File(s) :
/workspace/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_cgs_wrap[keymgr_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_cgs_wrap[keymgr_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[keymgr_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 1 13 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[keymgr_reg_block]
VARIABLE   EXPECTED   UNCOVERED   COVERED   PERCENT   GOAL   WEIGHT   AT LEAST   AUTO BIN MAX   COMMENT   
cp_is_mem 2 1 1 50.00 100 0 1 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_is_mem

Uncovered bins
NAMECOUNTAT LEASTNUMBERSTATUS
[auto[1]] 0 1 1


Covered bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 4994180 1 T1 1724 T2 29382 T3 4



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
values[0] 4993991 1 T1 1724 T2 29382 T3 4
values[1] 26 1 T18 1 T123 1 T129 2
values[2] 1 1 T156 1 - - - -
values[3] 105 1 T14 1 T34 1 T131 1



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
values[0] 4993982 1 T1 1724 T2 29382 T3 4
values[1] 18 1 T123 1 T129 2 T125 1
values[2] 5 1 T162 1 T156 2 T164 1
values[3] 110 1 T18 1 T52 1 T131 1



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAME   COUNT   AT LEAST   STATUS   TEST   COUNT   TEST   COUNT   TEST   COUNT   
auto[TlIntgErrNone] 4993895 1 T1 1724 T2 29382 T3 4
auto[TlIntgErrCmd] 87 1 T34 1 T123 3 T129 6
auto[TlIntgErrData] 96 1 T123 4 T129 7 T125 6
auto[TlIntgErrBoth] 102 1 T14 1 T18 1 T52 1