Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
100.00	100.00	1	100	1	1	64	64

Source File(s) :
/workspaces/repo/scratch/os_regression_2024_10_08/hmac-sim-vcs/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_cgs_wrap[hmac_reg_block]	100.00	1	100	1	64	64

---

Group Instance : tl_intg_err_cgs_wrap[hmac_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
100.00	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[hmac_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	0	14	100.00

Variables for Group Instance tl_intg_err_cgs_wrap[hmac_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	0	2	100.00	100	1	1	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	0	4	100.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	0	2	100.00

Automatically Generated Bins for cp_is_mem

Bins

NAME

COUNT

AT LEAST

STATUS

TEST

COUNT

TEST

COUNT

TEST

COUNT

auto[0]

57943732

1

T1

419

T2

6

T3

1

auto[1]

17640606

1

T1

63

T5

3564

T6

138

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	75584069	1			T1	482		T2	6		T3	1
values[1]	32	1			T65	3		T66	2		T141	4
values[2]	7	1			T66	1		T142	1		T143	1
values[3]	137	1			T64	2		T65	11		T66	9

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_data_err_bits

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	75584069	1			T1	482		T2	6		T3	1
values[1]	25	1			T65	3		T66	1		T141	1
values[2]	6	1			T65	1		T66	1		T141	1
values[3]	140	1			T64	4		T65	8		T66	9

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	75583928	1			T1	482		T2	6		T3	1
auto[TlIntgErrCmd]	141	1			T64	3		T65	12		T66	12
auto[TlIntgErrData]	141	1			T64	5		T65	8		T66	11
auto[TlIntgErrBoth]	128	1			T64	2		T65	10		T66	7