Unified Coverage Report :: Group :: cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg

SCORE	INSTANCES	WEIGHT	GOAL	AT LEAST	PER INSTANCE	AUTO BIN MAX	PRINT MISSING
85.71	91.67	1	100	1	1	64	64

Source File(s) :
/workspace/cover_reg_top/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

1 Instances:

NAME	SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
tl_intg_err_cgs_wrap[i2c_reg_block]	91.67	1	100	1	64	64

---

Group Instance : tl_intg_err_cgs_wrap[i2c_reg_block]

SCORE	WEIGHT	GOAL	AT LEAST	AUTO BIN MAX	PRINT MISSING
91.67	1	100	1	64	64

---

Summary for Group Instance tl_intg_err_cgs_wrap[i2c_reg_block]

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Variables	14	2	12	91.67

Variables for Group Instance tl_intg_err_cgs_wrap[i2c_reg_block]

VARIABLE	EXPECTED	UNCOVERED	COVERED	PERCENT	GOAL	WEIGHT	AT LEAST	AUTO BIN MAX	COMMENT
cp_is_mem	2	1	1	50.00	100	0	0	2
cp_num_cmd_err_bits	4	0	4	100.00	100	1	1	0
cp_num_data_err_bits	4	1	3	75.00	100	1	1	0
cp_tl_intg_err_type	4	0	4	100.00	100	1	1	0

Summary for Variable cp_is_mem

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	2	1	1	50.00

Automatically Generated Bins for cp_is_mem

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
[auto[1]]	0	0			-	-		-	-		-	-
auto[0]	83802	0			T1	40		T2	494		T3	1567

---

Summary for Variable cp_num_cmd_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	0	4	100.00

User Defined Bins for cp_num_cmd_err_bits

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	83600	1			T1	40		T2	494		T3	1567
values[1]	24	1			T54	3		T47	1		T61	3
values[2]	3	1			T55	1		T69	1		T62	1
values[3]	105	1			T54	2		T45	5		T47	9

---

Summary for Variable cp_num_data_err_bits

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
User Defined Bins	4	1	3	75.00

User Defined Bins for cp_num_data_err_bits

Uncovered bins

NAME	COUNT	AT LEAST	NUMBER	STATUS
values[2]	0	1	1

Covered bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
values[0]	83617	1			T1	40		T2	494		T3	1567
values[1]	17	1			T55	1		T60	1		T61	2
values[3]	107	1			T54	3		T45	1		T47	4

---

Summary for Variable cp_tl_intg_err_type

CATEGORY	EXPECTED	UNCOVERED	COVERED	PERCENT
Automatically Generated Bins	4	0	4	100.00

Automatically Generated Bins for cp_tl_intg_err_type

Bins

NAME	COUNT	AT LEAST	STATUS		TEST	COUNT		TEST	COUNT		TEST	COUNT
auto[TlIntgErrNone]	83502	1			T1	40		T2	494		T3	1567
auto[TlIntgErrCmd]	115	1			T54	6		T45	6		T47	14
auto[TlIntgErrData]	98	1			T54	4		T45	2		T47	4
auto[TlIntgErrBoth]	87	1			T45	2		T47	2		T55	7