Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
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Group : cip_base_pkg::tl_intg_err_cg_wrap::tl_intg_err_cg
SCOREINSTANCESWEIGHTGOALAT LEASTPER INSTANCEAUTO BIN MAXPRINT MISSING
100.00 100.00 1 100 1 1 64 64


Source File(s) :
/workspaces/repo/scratch/os_regression_2024_08_24/rv_dm-sim-vcs/default/sim-vcs/../src/lowrisc_dv_cip_lib_0/cip_base_env_cov.sv

2 Instances:
NAMESCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
tl_intg_err_cgs_wrap[rv_dm_mem_reg_block] 100.00 1 100 1 64 64
tl_intg_err_cgs_wrap[rv_dm_regs_reg_block] 100.00 1 100 1 64 64




Group Instance : tl_intg_err_cgs_wrap[rv_dm_mem_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[rv_dm_mem_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 0 14 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[rv_dm_mem_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 0 2 100.00 100 1 1 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0



Group Instance : tl_intg_err_cgs_wrap[rv_dm_regs_reg_block]
SCOREWEIGHTGOALAT LEASTAUTO BIN MAXPRINT MISSING
100.00 1 100 1 64 64




Summary for Group Instance tl_intg_err_cgs_wrap[rv_dm_regs_reg_block]

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Variables 14 1 13 100.00


Variables for Group Instance tl_intg_err_cgs_wrap[rv_dm_regs_reg_block]
VARIABLEEXPECTEDUNCOVEREDCOVEREDPERCENTGOALWEIGHTAT LEASTAUTO BIN MAXCOMMENT
cp_is_mem 2 1 1 50.00 100 0 0 2
cp_num_cmd_err_bits 4 0 4 100.00 100 1 1 0
cp_num_data_err_bits 4 0 4 100.00 100 1 1 0
cp_tl_intg_err_type 4 0 4 100.00 100 1 1 0


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 0 2 100.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[0] 1163618 1 T1 5 T2 1 T3 3
auto[1] 201640 1 T63 80 T64 80 T60 3083



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 1365080 1 T1 5 T2 1 T3 3
values[1] 15 1 T174 3 T171 1 T175 1
values[2] 3 1 T193 1 T194 1 T195 1
values[3] 85 1 T171 8 T175 5 T193 6



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 1365066 1 T1 5 T2 1 T3 3
values[1] 15 1 T174 1 T175 2 T193 1
values[2] 5 1 T174 1 T194 1 T196 1
values[3] 98 1 T174 3 T171 10 T175 9



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 1364978 1 T1 5 T2 1 T3 3
auto[TlIntgErrCmd] 88 1 T174 3 T171 4 T175 7
auto[TlIntgErrData] 102 1 T174 2 T171 9 T175 8
auto[TlIntgErrBoth] 90 1 T174 5 T171 7 T175 5


Summary for Variable cp_is_mem

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 2 1 1 50.00


Automatically Generated Bins for cp_is_mem

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
[auto[1]] 0 0 - - - - - -
auto[0] 323326 0 T1 9 T2 1 T3 1



Summary for Variable cp_num_cmd_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_cmd_err_bits

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 323143 1 T1 9 T2 1 T3 1
values[1] 15 1 T175 1 T193 1 T197 2
values[2] 7 1 T171 1 T193 1 T198 1
values[3] 104 1 T174 5 T171 8 T175 9



Summary for Variable cp_num_data_err_bits

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
User Defined Bins 4 0 4 100.00


User Defined Bins for cp_num_data_err_bits

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
values[0] 323137 1 T1 9 T2 1 T3 1
values[1] 19 1 T171 2 T175 1 T193 1
values[2] 5 1 T174 1 T175 1 T195 3
values[3] 90 1 T174 3 T171 11 T175 7



Summary for Variable cp_tl_intg_err_type

CATEGORYEXPECTEDUNCOVEREDCOVEREDPERCENT
Automatically Generated Bins 4 0 4 100.00


Automatically Generated Bins for cp_tl_intg_err_type

Bins
NAMECOUNTAT LEASTSTATUSTESTCOUNTTESTCOUNTTESTCOUNT
auto[TlIntgErrNone] 323046 1 T1 9 T2 1 T3 1
auto[TlIntgErrCmd] 91 1 T174 5 T171 4 T175 7
auto[TlIntgErrData] 97 1 T174 4 T171 8 T175 7
auto[TlIntgErrBoth] 92 1 T174 1 T171 8 T175 6

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